Inkjet Head Test Image Forming for Abnormal Element Detection

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Solution Overview

Problem

Existing methods for detecting abnormal recording elements in ink jet recording heads, such as those described in Japanese Patent Application Laid-Open No. 2005-246650, may fail to identify issues that arise from recording characteristics dependent on peripheral elements, leading to potential image quality deterioration.

Innovation Solution

A test image forming system that moves a recording head and medium in orthogonal directions, using input data to select recording elements and adjust gradation values, forming patterns that reflect peripheral recording conditions to reliably detect abnormal elements.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of operation

If a ruled line pattern test image is used for detecting abnormal recording elements, then the position of abnormal recording elements can be easily identified, but recording characteristics dependent on peripheral elements cannot be detected, leading to potential image quality deterioration

Engineering Contradiction:
Improveease of identifying abnormal element positionVSAvoidreliability of detecting abnormal elements under practical recording conditions
Core Design Contradiction:
Ease of operationVSReliability

Solution Approach 1:

The patent applies local quality by creating test images with different local recording patterns. Specifically, it uses test images where peripheral recording elements record continuous tones or gradients while the target recording element records ruled lines. This allows the test to reflect local recording conditions and detect abnormalities that occur only when peripheral elements are present, resolving the contradiction between easy identification and reliable detection under practical conditions.

Inventive Principle:
Principle #3Local quality

2Device complexity

If a test image with isolated recording elements is used, then detection simplicity is improved, but detection accuracy for practical image recording conditions deteriorates

Engineering Contradiction:
Improvesimplicity of test image structureVSAvoidaccuracy of detecting abnormal elements under practical conditions
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent applies parameter changes by varying the recording conditions in different regions of the test image. It changes the gradation values and recording patterns for peripheral elements versus target elements. For example, peripheral elements may record at 50% gradation while target elements record ruled lines, creating different local parameters that reflect practical recording conditions and improve detection accuracy while maintaining test structure.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS9573383B2Test image forming system and method, and abnormal recording element detection system and method
Publication Date: 2017.02.21 FUJIFILM CORP
  • US9573383B2 patent drawing
  • US9573383B2 patent drawing
  • US9573383B2 patent drawing

AI summary

The test image is formed in accordance with input data in which a plurality of recording elements selected every N (an integer of 1 or more) pieces in a projected recording element group is indicated as a first recording element and a recording element that is not selected as the first recording element is indicated as a second recording element, the input data allowing: a first-stage pattern to be formed in a recording area of the second recording element in accordance with a second input gradation value; a recording position in the second direction to be sequentially changed; and the first recording element and the second recording element to be sequentially switched to form a second-stage pattern to an (N+1)-th-stage pattern.