Input Detection Unit Secondary Dummy Pattern Coupling Prevention
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Solution Overview
Problem
As display devices with reduced non-detection areas experience increased coupling between signal lines and detection electrodes, leading to decreased driving reliability, there is a need for a solution to prevent such coupling and enhance input detection performance.
Innovation Solution
The input detection unit incorporates a substrate with a detection area and a non-detection area, featuring first and second electrodes, dummy patterns, and signal lines, where the secondary dummy pattern overlaps between the first pattern and the second signal line to prevent coupling, and the signal lines are connected to the patterns and pads to increase sensitivity and reliability.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Area of stationary object
If the non-detection area is reduced to enlarge the detection area, then the detection area is improved, but coupling between signal lines and detection electrodes occurs causing decreased driving reliability
Solution Approach 1:
The patent introduces dummy patterns as intermediary elements positioned between the signal lines and detection electrodes. These dummy patterns act as mediators that redirect electric field lines, preventing direct coupling between the signal lines and detection electrodes while maintaining the reduced non-detection area design. The dummy patterns are specifically placed in the non-detection area to intercept and redirect the electric fields.
Solution Approach 2:
The patent converts the potentially harmful coupling effect into a beneficial shielding effect. By intentionally placing dummy patterns in strategic positions, the electric field interaction that would normally cause coupling is redirected to create a shielding effect that protects the detection electrodes from unwanted signal interference, thereby improving driving reliability.
2Area of stationary object
If the non-detection area is reduced to enlarge the detection area, then the detection area is improved, but coupling between signal lines and detection electrodes occurs
Solution Approach 1:
The dummy patterns serve as intermediary structures that physically and electrically separate the signal lines from the detection electrodes. Positioned in the non-detection area, these dummy patterns intercept and redirect electric field lines, preventing the harmful coupling effect while allowing the detection area to be maximized.
Solution Approach 2:
The patent extracts the harmful coupling effect from the system by introducing dummy patterns that isolate the signal lines from the detection electrodes. The dummy patterns effectively remove the direct electric field interaction between these components, eliminating the coupling problem while maintaining the compact design.
3Reliability
If dummy patterns are placed between patterns and detection patterns to prevent coupling, then driving reliability is improved, but device complexity increases
Solution Approach 1:
The dummy patterns are merged with the existing electrode structure and fabricated using the same transparent conductive oxide material and deposition processes. This integration approach minimizes additional manufacturing steps and complexity while achieving the coupling prevention function. The dummy patterns are treated as part of the overall electrode system rather than separate components.
Data Source
AI summary
Provided is an input detection unit with a plurality of first electrodes and second electrodes insulated from the first electrodes. Dummy patterns are disposed between the patterns and the detection patterns. A secondary dummy pattern is disposed adjacent to the dummy patterns. Signal lines overlap the non-detection area. The signal lines include a first signal line connected to the patterns and a second signal line connected to the detection patterns. The plurality of patterns includes a row of patterns closest to the non-detection area. The secondary dummy pattern overlaps a portion between the row of patterns closest to the non-detection area and the second signal line.