Input Sensing Unit Mesh Pattern Overlap Reduction
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Solution Overview
Problem
Existing display devices face challenges in reducing the thickness of touch sensors and preventing resistance and short circuits between conductive lines, which affects the sensitivity and reliability of input sensing units, especially in flexible and deformable display devices.
Innovation Solution
The solution involves minimizing the overlapping area between the first and second conductive patterns in the input sensing unit, using a mesh pattern with specific line widths and shapes to reduce parasitic capacitance and prevent contamination from conductive particles, thereby enhancing sensitivity and preventing short circuits.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the overlapping area between the first conductive pattern and the second conductive pattern is reduced, then the sensitivity and reliability of the input sensing unit is improved, but the manufacturing complexity increases due to the need for precise mesh pattern alignment
Solution Approach 1:
The conductive patterns are divided into mesh structures with multiple small conductive lines arranged in a grid pattern. This segmentation reduces the overlapping area between the first and second conductive patterns while maintaining sufficient conductive pathways for signal transmission, thereby improving sensing reliability without requiring complete elimination of overlap
Solution Approach 2:
The mesh pattern design allows different regions of the conductive patterns to have different local characteristics. By optimizing the mesh line width, spacing, and orientation in specific regions, the patent achieves reduced parasitic capacitance and minimized short circuit risk in critical areas while maintaining overall pattern alignment feasibility
2Manufacturing precision
If the mesh pattern line width is reduced to minimize overlapping area, then the parasitic capacitance is reduced and sensitivity is improved, but the manufacturing precision requirements increase
Solution Approach 1:
The patent optimizes the mesh pattern line width within a specific range to achieve the desired balance. By carefully selecting and controlling the line width parameter, the design reduces parasitic capacitance and overlapping area while maintaining manufacturing feasibility and avoiding excessive precision requirements that would compromise reliability
3Reliability
If the overlapping area between conductive patterns is minimized, then the risk of micro resistance and short circuits is reduced, but the area of the input sensing unit increases
Solution Approach 1:
The mesh pattern segmentation allows the conductive lines to be distributed more efficiently across the sensing unit area. By using multiple thin conductive pathways arranged in a grid rather than thick overlapping lines, the patent reduces the risk of micro resistance and short circuits while maintaining a compact overall footprint
Data Source
AI summary
A display device including a display panel including a light emitting element and an encapsulation layer covering the light emitting element; and an input sensing unit disposed on the display panel. The input sensing unit includes a first conductive pattern disposed on the encapsulation layer, and including a first portion and a second portion extend from the first portion; an insulation layer covering the first conductive pattern; and a second conductive pattern disposed on the insulation layer, and including a third portion overlapping the at least a portion of the first portion of the first conductive pattern and a fourth portion extend from the third portion. A width of the first portion is less than a width of the second portion.