Input Sensor Test Patterns for Display Device Defect Detection

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Solution Overview

Problem

The fabrication of display devices often encounters failures, particularly in the input sensor component, which can be due to defects in the manufacturing process, leading to inefficiencies and suboptimal performance.

Innovation Solution

The proposed solution involves a display device design that includes a display panel with an input sensor featuring sensing electrodes, signal lines, and specific test patterns with varying stacking structures, utilizing transparent metal oxide materials and insulating layers to enhance reliability and detect manufacturing defects.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If multiple test patterns with different stacking structures are added to detect manufacturing defects, then measurement precision and reliability improve, but device complexity increases

Engineering Contradiction:
Improvedefect detection capabilityVSAvoidinput sensor structure
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The input sensor is segmented into multiple distinct test patterns (first, second, and third test patterns), each with different stacking structures. This segmentation allows independent testing of different manufacturing aspects without requiring complete disassembly or complex integrated testing mechanisms.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces a vertical stacking dimension by creating test patterns with different layer configurations (some with first insulating layer, others with second insulating layer, others with both). This dimensional variation enables comprehensive defect detection across different structural depths without increasing horizontal complexity.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Manufacturing precision

If transparent metal oxide patterns and insulating layers are used to enhance reliability, then manufacturing precision and defect detection improve, but ease of manufacture decreases

Engineering Contradiction:
Improveinput sensor fabrication accuracyVSAvoidfabrication process complexity
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

The patent employs transparent metal oxide materials with specific optical and electrical parameters to create test patterns that reveal manufacturing defects. By changing material parameters (using transparent metal oxides instead of conventional materials), the patent enables precise defect detection while maintaining compatibility with existing manufacturing processes.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The input sensor utilizes composite structures combining transparent metal oxide patterns with insulating layers (first and second insulating layers). These composite materials provide both the necessary electrical properties for sensing and the structural properties for defect detection, achieving high manufacturing precision through material composition rather than complex processing.

Inventive Principle:
Principle #40Composite materials

Data Source

PatentUS11762521B2Display device and a method of fabricating the same
Publication Date: 2023.09.19 SAMSUNG DISPLAY CO LTD
  • US11762521B2 patent drawing
  • US11762521B2 patent drawing
  • US11762521B2 patent drawing

AI summary

A display device including: a display panel; and an input sensor disposed on the display panel, wherein the input sensor includes: sensing electrodes; signal lines connected to the sensing electrodes; a first insulating layer; a second insulating layer disposed on the first insulating layer; and first, second and third test patterns having different stacking structures from each other, wherein the first test pattern include a first conductive pattern, a first insulating pattern overlapping the first conductive pattern, and a second insulating pattern overlapping the first insulating pattern, the second test pattern includes a third insulating pattern and a fourth insulating pattern overlapping the third insulating pattern, andthe third test pattern includes a second conductive pattern.