Reducing Input Voltage for Processing Devices

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Computing devices face challenges in reducing power consumption while maintaining performance, as existing methods often require significant voltage margins to account for manufacturing variations and operational stresses, leading to increased component stress and reduced reliability.

Innovation Solution

A method is introduced to determine reduced operating voltages for processing devices by incrementally adjusting input voltages during functional tests that exercise the entire computing system, allowing for power savings without performance degradation, and employing voltage regulation modules to set input voltages below manufacturer-specified levels.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If manufacturer specified operating voltage is used, then reliability is ensured, but power consumption increases

Engineering Contradiction:
Improvecomponent reliabilityVSAvoidpower consumption
Core Design Contradiction:
ReliabilityVSUse of energy by moving object

Solution Approach 1:

The patent changes the voltage parameter from the manufacturer-specified operating voltage to a reduced voltage level determined through functional testing. The system identifies the minimum voltage required for proper device operation and operates at that level rather than the higher manufacturer-specified voltage, thereby reducing power consumption while maintaining reliability

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent implements dynamic voltage adjustment by conducting functional tests to determine the actual minimum operating voltage for each device. This dynamic approach allows the system to adapt the voltage level to the specific device characteristics and operational requirements, rather than using a fixed manufacturer-specified voltage for all devices

Inventive Principle:
Principle #15Dynamics

2Reliability

If voltage margins are increased to account for manufacturing variations, then reliability is improved, but component stress increases

Engineering Contradiction:
Improveoperational reliabilityVSAvoidcomponent stress
Core Design Contradiction:
ReliabilityVSStress or pressure

Solution Approach 1:

The patent changes the voltage parameter from a conservative manufacturer-specified level with built-in margins to an empirically determined minimum operating voltage. This reduces the voltage margin while simultaneously reducing component stress, as the voltage is set based on actual device performance rather than conservative estimates

Inventive Principle:
Principle #35Parameter changes

3Power

If higher operating voltage is used, then power delivery capability is improved, but heat generation increases

Engineering Contradiction:
Improvepower delivery capabilityVSAvoidheat generation
Core Design Contradiction:
PowerVSTemperature

Solution Approach 1:

The patent reduces the operating voltage parameter to the minimum level required for proper device function. This voltage reduction directly decreases power consumption and heat generation, eliminating the need for higher voltage operation and its associated thermal problems

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS10338670B2Input voltage reduction for processing devices
Publication Date: 2019.07.02 MICROSOFT TECHNOLOGY LICENSING LLC
  • US10338670B2 patent drawing
  • US10338670B2 patent drawing
  • US10338670B2 patent drawing

AI summary

Voltage adjustment techniques for computing systems and processing devices are presented herein. In one example, a method of determining operating voltages for a processing device includes executing a voltage adjustment process to determine at least one input voltage for the processing device lower than a manufacturer specified operating voltage. During the voltage adjustment process, the method includes applying incrementally adjusted input voltages to the processing device, operating the processing device according to a functional test that exercises the processing device in context with associated system elements of a computing assembly, and monitoring for operational failures of at least the processing device during application of each of the incrementally adjusted input voltages. Responsive to the operational failures, the method includes determining corresponding values of the incrementally adjusted input voltages and establishing an input voltage based at least in part on the corresponding values of the incrementally adjusted input voltages.