In-situ Inspection for Machine Tool Table Accuracy
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Current machine tool table inspection processes require separate inspections after fabrication, making it difficult to identify and rectify accuracy issues before they cause errors, and existing methods lack the precision to detect dynamic offsets of cutting tools effectively.
Innovation Solution
Implementing in-situ inspection processes using three-dimensional axis gauges, electronic gauge blocks, and flexible probes to determine refined positions and dynamic offsets of cutting tools, enabling real-time accuracy adjustments and feedback integration between CAD and CAM systems for improved precision and quality control.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If separate inspection processes are used after fabrication, then inspection can be performed on finished parts, but accuracy issues cannot be identified and rectified before they cause errors
Solution Approach 1:
The patent implements in-situ inspection processes that perform measurements and detect dynamic offsets during the fabrication process itself, rather than after completion. This preliminary detection allows accuracy issues to be identified and rectified while the part is still being manufactured, preventing errors from propagating and reducing rework time.
Solution Approach 2:
The system integrates real-time feedback mechanisms where inspection data from in-situ measurements is immediately fed back to adjust fabrication parameters. This closed-loop feedback enables continuous correction of dynamic offsets and maintains accuracy throughout the fabrication process, rather than discovering issues only after completion.
2Measurement precision
If traditional inspection methods are used, then inspection processes are simple, but they lack the precision to detect dynamic offsets of cutting tools effectively
Solution Approach 1:
The patent introduces specialized intermediary devices including three-dimensional axis gauges, electronic gauge blocks, and flexible probes that serve as mediators between the cutting tools and measurement systems. These intermediaries enable precise detection of dynamic offsets by translating tool positions and movements into measurable data, achieving high measurement precision while maintaining manageable system complexity through modular design.
Solution Approach 2:
The system replaces traditional mechanical inspection methods with electronic and optical measurement technologies. Electronic gauge blocks and digital sensors substitute for mechanical dial indicators, enabling more precise detection of dynamic offsets while reducing mechanical complexity through electronic signal processing and digital data analysis.
3Manufacturing precision
If in-situ inspection processes are implemented, then accuracy of machine tool table operations is enhanced, but the inspection process becomes more complex
Solution Approach 1:
The patent designs multi-functional inspection devices that can perform multiple measurement tasks using the same hardware platform. The three-dimensional axis gauges and electronic gauge blocks can measure various parameters including position, orientation, and dynamic offsets, reducing the need for multiple specialized devices and simplifying the overall inspection process while maintaining high manufacturing precision.
Solution Approach 2:
The inspection system is designed to be self-calibrating and self-correcting, where the measurement devices automatically compensate for their own errors and drift. The system performs self-validation checks and automatically adjusts for thermal expansion and mechanical wear, reducing the complexity of manual calibration and maintenance procedures while sustaining high accuracy levels.
Data Source
AI summary
A non-volatile computer readable storage medium has instructions executed by a processor to collect from a communication interface a first set of probe signals from a three dimensional axis gauge characterizing axis directions of a table. Axes directions for the table relative to a vise on the table are computed from the first set of probe signals. A second set of probe signals from electronic gauge blocks that characterize position of the table are collected from the communication interface. Actual table positions are computed from the second set of probe signals. Table position residuals between the actual table positions and desired table positions are computed. The table position residuals are conveyed to the communication interface.