Inspection Apparatus Multi-Defect Detection via Image Processing
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Solution Overview
Problem
Conventional surface inspection apparatuses require multiple inspection units or complex image capturing conditions to detect various surface shapes, making the inspection process cumbersome and costly.
Innovation Solution
An inspection apparatus that captures a single image and uses image processing to differentiate between regions with distinct intensity distributions of reflected light, allowing for multiple types of surface inspections to be performed on a cylindrical or spherical inspection target.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If multiple inspection units or complex image capturing conditions are used to detect various surface shapes, then detection capability is improved, but device complexity and manufacturing cost increase
Solution Approach 1:
The patent applies universality by enabling a single inspection apparatus to perform multiple types of surface inspections (scratch detection, stain detection, bulge detection) through software-based image processing rather than requiring separate dedicated inspection units for each defect type. The same imaging unit and illumination unit are used universally across different inspection modes.
Solution Approach 2:
The patent changes the parameters of image processing (such as intensity distribution analysis, gradient calculations, and threshold values) to adapt to different surface defect types. By adjusting processing parameters rather than hardware configuration, the system achieves versatile detection capability while maintaining simple apparatus structure.
2Measurement precision
If multiple inspection units are provided to correspond to different surface shapes, then detection precision is improved, but manufacturing cost increases
Solution Approach 1:
The patent eliminates the need for multiple dedicated inspection units by making a single unit universally capable of detecting different surface defects through configurable image processing algorithms. This reduces manufacturing costs while maintaining detection precision through software-based adaptation.
Solution Approach 2:
The patent creates virtual copies of specialized inspection capabilities through image processing algorithms rather than physical hardware copies. Each defect type is detected by applying specific processing routines to the same captured image, achieving the effect of multiple inspection units without their associated manufacturing costs.
3Adaptability or versatility
If a plurality of images are acquired under different imaging conditions, then detection capability is improved, but inspection process complexity increases
Solution Approach 1:
The patent employs periodic action by switching between different image processing modes and analysis methods in a systematic sequence. The inspection process periodically applies different algorithms (intensity distribution analysis, gradient calculation, threshold-based detection) to the captured image to identify various defect types, maintaining detection capability while simplifying the overall process.
Solution Approach 2:
Instead of acquiring multiple images under different physical imaging conditions, the patent changes the parameters of image processing to achieve different detection objectives from a single captured image. This includes varying intensity thresholds, gradient directions, and analysis regions, which simplifies the inspection process while maintaining versatile detection capability.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables efficient and cost-effective performance of multiple surface inspections using a single imaging unit and illumination unit, simplifying the apparatus configuration and reducing manufacturing costs while effectively detecting minute unevenness and defects like scratches or dust adherence.
Implementation Method 1
an inspection apparatus which detects a surface shape of an object to be inspected by irradiating a surface of the object with illumination light and detecting reflected light from the object
Data Source
AI summary
An inspection apparatus includes a captured image acquiring unit configured to acquire a captured image that is acquired by shooting an inspection target, an acquiring unit configured to acquire from the captured image a first image region and a second image region whose intensity distributions of reflected light with respect to an incident angle of illumination light emitted to the inspection target are different, and an image processing unit configured to perform image processing for performing different surface inspections on the first image region and the second image region respectively.