Inspection Condition Determination Using 3D Model Flaw Simulation
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Solution Overview
Problem
Conventional image inspection techniques face challenges in achieving accurate flaw detection due to the variability of flaw types and positions, requiring trial-and-error adjustments of optical conditions, which limits their effectiveness in detecting a wide range of flaws.
Innovation Solution
A device and method that utilize a three-dimensional model to simulate flaws and replicate various optical conditions, including camera and illumination positions, light characteristics, and lens types, to generate images and determine optimal conditions for detecting multiple flaw patterns comprehensively.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If optical conditions are adjusted based on past experience or trial and error, then the inspection can be performed, but the accuracy and reliability of flaw detection is insufficient
Solution Approach 1:
The patent creates a three-dimensional model of the inspection target and adds virtual flaw data to it, then generates images by replicating optical conditions on the model. This copying approach allows systematic evaluation of multiple optical conditions without physical trial-and-error, enabling accurate determination of optimal conditions for detecting various flaw patterns.
Solution Approach 2:
The patent performs preliminary actions by pre-generating images with added flaw data under multiple optical conditions before actual inspection. The determination unit evaluates these pre-generated images to identify optimal optical conditions, allowing the inspection system to be properly configured in advance rather than relying on trial-and-error during actual inspection.
2Adaptability or versatility
If a single optical condition is used for inspection, then the inspection process is simple, but it cannot comprehensively detect various flaw patterns
Solution Approach 1:
The patent determines optimal optical conditions that can detect multiple types of flaws simultaneously. By using the three-dimensional model with added flaw data and systematic image generation, the system identifies optical conditions that serve multiple detection functions, allowing a single configured system to handle various flaw patterns rather than requiring separate optimization for each flaw type.
3Measurement precision
If optical conditions are adjusted for each specific flaw type, then detection accuracy for that flaw type improves, but the time required for condition selection increases
Solution Approach 1:
The patent performs all optical condition evaluations in advance by generating images with added flaw data under multiple conditions and using the determination unit to identify optimal conditions. This preliminary action eliminates the need for time-consuming trial-and-error during actual inspection, as the optimal optical conditions are predetermined through systematic evaluation of the three-dimensional model.
Data Source
AI summary
An inspection condition determination device comprises: an addition unit that adds data mimicking a flaw assumed to occur in an inspection target to a designated position of a three-dimensional model of the inspection target; a generation unit that generates an image without a flaw by replicating an optical condition for capturing an image of the inspection target on the three-dimensional model, and an image with the flaw by replicating the optical condition on the three-dimensional model to which the data mimicking the flaw is added; a determination unit that determines whether or not a difference between the image without a flaw and the image with the flaw at the designated position exceeds a threshold that allows detection of the flaw in the inspection target; and an extraction unit that extracts an optical condition available for detecting flaws of multiple designated patterns from multiple optical conditions.