Distributed Inspection Data Management With Local Key-Value Storage
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing production systems face challenges in efficiently managing large volumes of inspection data from multiple apparatuses, leading to data consistency issues and processing bottlenecks when using a single database to collect inspection results.
Innovation Solution
Implementing a key-value database on inspection apparatuses for storing and managing inspection result data, allowing for efficient storage and delayed transmission to a management server, which also includes a key-value and relational database for easy data conversion and analysis.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If a single database is used to collect inspection result data from multiple inspection apparatuses, then data centralization is achieved, but processing bottlenecks and data consistency issues occur
Solution Approach 1:
The patent divides the centralized database system into distributed database units at each inspection apparatus. Each apparatus maintains its own database, segmenting the data management function across multiple independent nodes, thereby eliminating the single-point bottleneck while maintaining data accessibility.
Solution Approach 2:
The patent introduces a hierarchical data management structure with local databases at the apparatus level and a central management server at the system level. This adds a spatial dimension to data storage, allowing data to exist simultaneously at multiple levels (local and central) without forcing all data through a single collection path.
2Adaptability or versatility
If a single database is used to collect inspection result data from multiple inspection apparatuses, then data centralization is achieved, but data consistency and association complexity increase
Solution Approach 1:
The patent extracts the data storage function from the central management server and places it at each inspection apparatus. This separation allows each apparatus to independently manage its own data with simple local storage rules, while the central server focuses only on data retrieval and analysis, reducing overall system complexity.
Solution Approach 2:
Each inspection apparatus autonomously manages its own database, performing local data storage, retrieval, and validation without requiring centralized coordination for every operation. This self-service approach simplifies data management at the source while reducing the burden on the central system.
3Stability of the object's composition
If inspection result data is stored in traditional database format, then data structure is maintained, but searching and retrieval efficiency decrease
Solution Approach 1:
The patent changes the data storage parameter from traditional relational database format to key-value database format. This parameter change optimizes the data structure for rapid retrieval operations while maintaining data integrity, allowing O(1) time complexity for data access compared to the O(n) or O(log n) complexity of traditional databases.
Solution Approach 2:
The patent employs a hybrid data storage approach by implementing both key-value databases at the apparatus level for fast retrieval and traditional relational databases at the central server for structured analysis. This composite approach leverages the strengths of both database types for different operational requirements.
Data Source
Figure 1
Figure 2~4
Figure 5~7
AI summary
An inspection system is provided that can efficiently perform the management of data obtained from a plurality of apparatuses. An inspection system (10) includes inspection apparatuses (11 a), (11 b) and (11c) to inspect products that are produced in a factory, and a management server (30) that is connected via a communication line to the inspection apparatuses (11a), (11 b) and (11c). The inspection apparatus (11a) includes an apparatus-side inspection result DB (database) (14a). The apparatus-side inspection result DB (14a) stores the inspection result data, which is data representing the result of inspecting a substrate with the inspection apparatus (11 a). The apparatus-side inspection result DB (14a) is a key-value database that is constituted by keys and values.