Inspection Device Parallel Conveyance for Reduced Takt Time
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Solution Overview
Problem
In existing inspection devices, the substrate cannot be carried out until processing of inspection and count is completed, leading to standby time for the next substrate and a decline in throughput.
Innovation Solution
The inspection device is configured with a conveying unit that includes multiple conveyance units arrayed in series, allowing for individual control of each unit. This enables separate management of loading and imaging processes with one conveyance unit and inspection and count processes with another, allowing for concurrent processing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If a single conveyance unit performs all operations from loading to unloading, then the device structure is simple, but the throughput declines due to standby time
Solution Approach 1:
The conveying unit is divided into multiple conveyance units (first conveyance unit and second conveyance unit) that operate independently. The first conveyance unit handles loading and imaging operations, while the second conveyance unit handles inspection and count operations. This segmentation allows parallel processing of different substrates at different stages, eliminating standby time and improving throughput without requiring a completely new system architecture.
2Productivity
If the substrate waits for inspection and count completion before being carried out, then the inspection process is thorough, but the inspection time increases
Solution Approach 1:
The first conveyance unit performs loading and imaging operations in advance while the second conveyance unit simultaneously performs inspection and count operations on previously imaged substrates. This preliminary action approach ensures that imaging is completed before inspection begins, maintaining inspection completeness while reducing overall inspection time through overlapping operations.
3Productivity
If multiple conveyance units are used for parallel processing, then the throughput improves, but the device complexity increases
Solution Approach 1:
Both the first and second conveyance units are designed with similar functional capabilities, allowing either unit to potentially perform loading, imaging, inspection, or count operations depending on system demands. This multi-functionality provides flexibility in operation modes and maintains ease of manufacture and maintenance while enabling parallel processing for improved throughput.
Data Source
Figure 1
Figure 2
Figure 3(a)~3(b)
AI summary
To provide an inspection device capable of reducing time required for inspection (takt time) by managing processing of loading and imaging an inspection object and processing of inspection and count with different conveyance units. An inspection device 10 includes an imaging unit 20, a conveying unit 40, and a controlling unit 30, the conveying unit 40 includes first and second conveyance units 41 and 42, an operation of each of the conveyance units can be individually controlled by the controlling unit 30, the first conveyance unit 41 is arranged in an imaging area, and the second conveyance unit 42 is arranged in an inspection/count area (standby area). In addition, when an image of an inspection object 12 having been moved to the imaging area by the first conveyance unit 41 is being captured, the controlling unit 30 causes the second conveyance unit 42 to unload another inspection object from the inspection/count area.