Inspection System Using Dual Electromagnetic Waves for Object Detection
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Solution Overview
Problem
Existing inspection systems using radar technology often incorrectly identify electronic devices as dangerous objects, leading to inefficient inspections as they require individuals to remove items and stand still, reducing the inspection's efficiency.
Innovation Solution
An inspection system comprising a primary device that transmits electromagnetic waves to estimate the presence of dangerous objects and a secondary device that distinguishes electronic devices within the inspection area using different electromagnetic waves, allowing for continuous scanning without the need for individuals to stop or remove items.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Area of stationary object
If radar-based inspection systems determine dangerous objects based on reflected electromagnetic wave intensity or image shape, then inspection coverage is improved, but measurement precision deteriorates leading to erroneous identification of electronic devices as dangerous objects
Solution Approach 1:
The patent introduces a secondary electromagnetic wave receiving device as an intermediary to detect electronic devices specifically. This mediator device uses different electromagnetic waves than the primary radar to identify electronic devices, allowing the system to distinguish them from dangerous objects and eliminate false positives while maintaining broad inspection coverage.
2Measurement precision
If the inspection system requires the inspection target to stop and remove electronic devices to prevent erroneous determination, then measurement precision is improved, but productivity deteriorates due to reduced inspection efficiency
Solution Approach 1:
The system performs preliminary detection of electronic devices using the secondary electromagnetic wave receiving device before the main inspection process. By identifying electronic devices in advance, the system can exclude them from dangerous object classification without requiring the inspection target to stop or remove items, thereby maintaining both accuracy and efficiency.
3Device complexity
If the inspection system uses a single electromagnetic wave transmitting device, then device complexity is reduced, but measurement precision deteriorates due to inability to distinguish electronic devices from dangerous objects
Solution Approach 1:
The patent segments the inspection system into two distinct functional parts: a primary electromagnetic wave transmitting device for detecting dangerous objects, and a secondary electromagnetic wave receiving device for detecting electronic devices. This segmentation allows each device to be optimized for its specific detection task, improving overall identification accuracy while maintaining relatively simple individual device structures.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system effectively differentiates between electronic devices and dangerous objects, reducing erroneous determinations and maintaining inspection efficiency by allowing continuous scanning of individuals as they move.
Implementation Method 1
An example of such an inspection system uses a radar. The inspection system transmits an electromagnetic wave to an inspection target and receives a reflected electromagnetic wave.
Implementation Method 2
an antenna device configured to receive a first electromagnetic wave
Data Source
AI summary
According to one embodiment, an inspection system includes a first circuitry estimating whether an inspection target possesses a predetermined object, an antenna receiving a first electromagnetic wave, a second circuitry determining whether an electronic device is present in a predetermined range based on the first electromagnetic wave, and a third circuitry determining whether the inspection target possesses the predetermined object based on an estimation result of the first circuitry and a determination result of the second circuitry.