Multi-Device Inspection Image Correction via Calibration Jig

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Solution Overview

Problem

Existing inspection systems face challenges in accurately correcting images across multiple inspection devices due to optical aberrations and displacement differences, leading to inconsistent inspection results.

Innovation Solution

The system employs a calibration jig to acquire feature data from both inspection devices, calculating a correction amount to align the image features, allowing for accurate image correction and inspection across devices.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If images are obtained by multiple inspection devices with different optical systems, then inspection coverage is increased, but image consistency deteriorates due to optical aberrations and displacement differences

Engineering Contradiction:
Improveinspection coverageVSAvoidimage consistency
Core Design Contradiction:
Adaptability or versatilityVSMeasurement precision

Solution Approach 1:

A calibration jig with known feature points is introduced as an intermediary object to be imaged by all inspection devices. The feature data extracted from this common reference object serves as a mediator to calculate correction amounts that align images across different devices, resolving the consistency issue while maintaining multi-device inspection capability

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The system changes the parameters of the imaging conditions by calculating correction amounts based on feature data from the calibration jig. These correction amounts adjust parameters such as position, orientation, and scale of images obtained by different inspection devices, enabling consistent inspection results across multiple devices with different optical characteristics

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If correction amounts are calculated to align images from different inspection devices, then image consistency is improved, but calibration complexity increases

Engineering Contradiction:
Improveimage consistencyVSAvoidcalibration complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The calibration jig creates a standardized copy of known feature points that can be imaged by any inspection device. This copy serves as a universal reference that simplifies the calibration process, as the same feature data can be used across multiple devices without requiring complex device-specific calibration procedures

Inventive Principle:
Principle #26Copying

Solution Approach 2:

The calibration process is performed as a preliminary action before actual inspection. By pre-calculating correction amounts based on feature data from the calibration jig, the system prepares the necessary correction parameters in advance, simplifying the overall calibration complexity while ensuring image consistency during inspection

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS10861149B2Inspection system and method for correcting image for inspection
Publication Date: 2020.12.08 FANUC LTD
  • US10861149B2 patent drawing
  • US10861149B2 patent drawing
  • US10861149B2 patent drawing

AI summary

An inspection system includes a first imaging device provided in a first inspection device; a second imaging device provided in a second inspection device; a first controller; and a second controller, wherein the first controller acquires a particular feature of a calibration jig, which is positioned in the first inspection device, from an image of the calibration jig obtained by the first imaging device as first feature data, and the second controller acquires the particular feature of the calibration jig, which is positioned in the second inspection device, from an image of the calibration jig obtained by the second imaging device as second feature data. The correction amount needed for correcting the image obtained by the second imaging device so that the second feature data matches the first feature data is acquired, and the second inspection device corrects an image of an inspection subject using this correction amount.