Inspection Jig Segmented Contactor for Probe Replacement
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Solution Overview
Problem
Existing inspection jigs, such as probe cards, require the entire flexible substrate to be replaced when a single contact portion breaks down, leading to significant time and cost expenditures due to frequent breakdowns of contact portions.
Innovation Solution
An inspection jig design featuring a rigid substrate, a flexible substrate with protruding contact pads supported by a pedestal block, and a detachable contactor with replaceable probes that contact the pads, allowing individual probe replacement without replacing the entire flexible substrate.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the flexible substrate is used with contact portions that directly contact the inspection object, then the inspection jig can perform electrical characteristic inspection, but the contact portions break down frequently during repeated use requiring replacement of the entire flexible substrate
Solution Approach 1:
The contactor is divided into two separable parts: the contact housing (which remains attached to the flexible substrate) and the probe (which can be individually replaced). This segmentation allows only the broken probe to be replaced while the contact housing and other probes remain in use, resolving the contradiction by reducing replacement time and frequency while maintaining reliable electrical contact.
Solution Approach 2:
The contact housing serves as an intermediary component between the flexible substrate and the probe. It provides a stable mounting structure that protects the probe connection point and enables easy probe replacement without affecting the flexible substrate or other probes, thus improving reliability while minimizing replacement time.
2Device complexity
If the contactor is designed with a fixed probe structure, then the structure is simple, but the entire flexible substrate must be replaced when a probe breaks down
Solution Approach 1:
The contactor is segmented into a contact housing and a detachable probe. The contact housing maintains the simple structural integration with the flexible substrate, while the probe can be individually replaced. This segmentation resolves the contradiction by keeping the overall structure simple yet enabling quick probe replacement to maintain high inspection throughput.
Solution Approach 2:
The probe is designed with dynamic replaceability while the contact housing remains fixed. This allows the system to adapt to probe wear or damage by replacing only the necessary component, maintaining productivity without requiring complex reconfiguration of the entire contactor structure.
3Reliability
If the entire flexible substrate is replaced when a contact portion breaks, then all contact portions are renewed, but the cost and time for replacement increase significantly
Solution Approach 1:
By segmenting the contactor into a reusable contact housing and a replaceable probe, the invention allows only the broken probe to be discarded and replaced. This resolves the contradiction by maintaining reliable contact functionality while minimizing material waste, as the majority of the contactor structure (contact housing and other probes) continues to be used.
Solution Approach 2:
The invention enables selective discarding of only the broken probe while recovering and reusing the contact housing and intact probes. This approach maintains contact portion functionality while significantly reducing material waste compared to replacing the entire flexible substrate.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This design suppresses breakdowns of contact portions by enabling individual probe replacement, reducing downtime and costs associated with replacing the flexible substrate during mass production.
Implementation Method 1
a biasing unit configured to bias the support in the first direction with respect to the rigid substrate
Data Source
AI summary
An inspection jig includes a rigid substrate, a flexible substrate connected to the rigid substrate, a support supporting a part of the flexible substrate in a state that the part of the flexible substrate is protruded with respect to the rigid substrate in a first direction, a biasing unit configured to bias the support in the first direction with respect to the rigid substrate, and a contactor provided on a protruding portion of the flexible substrate, the protruding portion being protruded with respect to the rigid substrate. The contactor includes a contact housing, and a probe supported on the contact housing. One end of the probe is in contact with a contact portion on the protruding portion.