Material Property Inspection Apparatus Using Light Intensity Ratios
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Solution Overview
Problem
Existing material property inspection methods for food and medicine are large-scale, expensive, and can damage objects with poor transmittance, requiring high-power infrared radiation and lengthy measurement times, making them unsuitable for nondestructive, high-speed inspections in manufacturing processes.
Innovation Solution
A compact and cost-effective inspection apparatus that uses a conveyance unit, light source, irradiation unit, light receiving unit, signal detection unit, and processing unit to measure light intensity of transmitted or reflected light, calculating material properties using known test pieces and a calibration curve, allowing for rapid and non-damaging inspections.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If infrared absorption spectrum analysis is used to measure material properties, then measurement capability is achieved, but the apparatus becomes large-scale and expensive
Solution Approach 1:
The patent extracts only the essential measurement function from complex infrared spectroscopy systems by using a simple light source, light receiver, and processor that measures light intensity ratios. This eliminates unnecessary components while retaining the core capability to determine material properties through optical absorption measurements.
Solution Approach 2:
The invention replaces expensive, sophisticated infrared spectrometers with inexpensive, simple optical components including basic light sources and photodetectors. This substitution achieves acceptable measurement precision at a fraction of the cost and complexity of traditional infrared absorption spectrum analysis apparatus.
2Measurement precision
If high-power broadband infrared rays are used to inspect objects with poor transmittance, then measurement capability is improved, but the inspected object may be damaged
Solution Approach 1:
The patent changes the measurement parameter from requiring high-power broadband infrared radiation to using lower-power monochromatic or narrowband light. By measuring the ratio of light intensities at different wavelengths, the system achieves measurement capability for objects with poor transmittance without using harmful high-power radiation that could damage the inspected object.
3Measurement precision
If absorbance spectrum measurement is performed to determine component content, then measurement accuracy is achieved, but measurement time increases
Solution Approach 1:
Instead of measuring the complete absorbance spectrum across multiple wavelengths, the patent measures light intensity ratios at specific wavelength pairs. This partial measurement approach provides sufficient information for component content determination while dramatically reducing measurement time compared to full spectral analysis.
4Measurement precision
If light intensity ratio measurement is used for high-loss inspected objects, then measurement becomes difficult, but this requires expensive measurement systems
Solution Approach 1:
The patent introduces a reference wavelength measurement as an intermediary that enables accurate measurement of light intensity ratios for high-loss objects. By comparing the inspected object's light transmission at the measurement wavelength against a reference wavelength, the system achieves accurate component content determination using simple, inexpensive photodetectors rather than expensive specialized measurement systems.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables rapid, non-destructive, and cost-effective inspection of material properties like content, density, and porosity without damaging the object, using a calibration curve to determine quality based on light intensity measurements.
Implementation Method 1
a light source 3 that generates light including specific wavelength determined by a material property of the inspected object; an irradiation unit 4 that irradiates the light to the inspected object conveyed by the conveyance unit; a light receiving unit 5 that receives transmitted light or reflected light of the inspected object
Data Source
AI summary
A material property inspection apparatus includes a conveyance unit, a light source, an irradiation unit, a light receiving unit, a signal detection unit, a material property value input unit, an inspection set value input unit, and a processing unit. The processing unit calculates a relation equation between the material property value from the material property values of the plurality of test pieces and the light intensity of the transmitted light or the reflected light of respective test pieces, calculates the material property value of the inspected object from the light intensity of the transmitted light or the reflected light detected by the signal detection unit and the relation equation, compares the calculated material property value of the inspected object with the inspection set value inputted from the inspection set value input unit, and determines the quality of the inspected object.