Image Inspection Apparatus Merging Overlapping Defect Frames
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Solution Overview
Problem
Existing image inspection systems struggle to effectively merge and display overlapping frames indicating detected regions of defects in inspection target images, leading to cluttered and difficult-to-interpret visual representations for users.
Innovation Solution
The system acquires inspection target image data, compares it with comparison image data to detect regions of defects, and merges overlapping display frames into a single frame, eliminating overlaps to provide a clear and uncluttered display of detected defects on the inspection target image.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If multiple display frames indicating detected regions are displayed separately, then each defect region is clearly indicated, but the display becomes cluttered and difficult to interpret when frames overlap
Solution Approach 1:
The patent merges overlapping display frames into a single unified frame that encompasses all detected defect regions. When multiple frames overlap, the system combines them into one composite frame rather than displaying separate frames, thereby eliminating visual clutter while maintaining accurate defect indication. This resolving principle directly addresses the contradiction by combining multiple indicators into a single clear visual element.
2Loss of information
If multiple display frames are displayed to indicate all detected regions, then complete defect information is provided, but the complexity of the display increases
Solution Approach 1:
The system merges multiple display frames into a single composite frame that contains all detected defect regions. This merging process maintains complete defect information while reducing display complexity from multiple separate frames to one unified frame structure, directly resolving the contradiction between information completeness and display simplicity.
Solution Approach 2:
The patent segments the merging process into steps: detecting all defect regions, identifying overlapping frames, and combining them into a unified structure. This segmentation allows the system to maintain comprehensive defect detection while systematically reducing visual complexity through controlled merging operations.
Data Source
AI summary
An image inspection apparatus includes processing circuitry. The processing circuitry acquires inspection target image data. The processing circuitry compares the acquired inspection target image data with comparison image data to detect a plurality of regions of an inspection target image as a plurality of detection target images. The processing circuitry merges a plurality of display frames indicating the plurality of regions detected as the plurality of inspection target images, which are determined to overlap, into a display frame after merge. The processing circuitry displays the display frame after merge on the inspection target image. The display frame includes the plurality of regions detected as the plurality of detection target images.