Inspection Pad Design for Display Substrate Probe Efficiency
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Solution Overview
Problem
The varying number and arrangement of pads on display devices require different probe configurations for inspection, leading to increased costs and reduced inspection efficiency.
Innovation Solution
A substrate design with a display area, surrounding area, and inspection pad portion featuring aligned first, second, and third pads connected by conductive lines, allowing probes to contact these pads for inspection signal supply, enabling the use of multiple probe configurations for efficient inspection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If different probe configurations are prepared for each product specification, then inspection accuracy is maintained, but costs increase and inspection efficiency decreases
Solution Approach 1:
The inspection pad portion is designed with a standardized configuration that can be universally applied across different display devices regardless of product specification. This allows a single probe configuration to inspect multiple product types, eliminating the need for multiple specialized probe configurations while maintaining inspection accuracy and improving efficiency
2Measurement precision
If different probe configurations are prepared for each product specification, then inspection accuracy is maintained, but device complexity increases
Solution Approach 1:
The inspection pad portion uses a standardized pad arrangement and conductive line configuration that serves multiple inspection purposes across different product specifications. This universal design simplifies the probe configuration to a single standardized type, reducing device complexity while maintaining the ability to accurately inspect various display devices
Solution Approach 2:
The inspection pad portion is segmented into first pads, second pads, and third pads with specific functional divisions. This segmentation allows a single probe configuration to perform multiple inspection functions by targeting different pad groups, reducing the need for complex multi-purpose probes
Data Source
AI summary
According to one embodiment, a substrate includes a display area including a plurality of pixels, a surrounding area that surrounds the display area, and an inspection pad portion provided in the surrounding area, and the inspection pad portion includes a plurality of first pads and a plurality of second pads aligned in a first direction, a plurality of third pads aligned in the first direction, and arranged at positions displaced from the plurality of first pads in a second direction intersecting the first direction, and a plurality of first conductive lines connecting the plurality of first pads with the plurality of third pads, respectively.