Inspection Pad Reduction via Switch Element Signal Sharing
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Solution Overview
Problem
In downsized liquid crystal display panels, especially for mobile phones and smartphones, the limited area available for arranging inspection pad electrodes becomes a challenge when multiple control signals need to be input, leading to difficulties in ensuring sufficient space and increased complexity in inspection processes.
Innovation Solution
The solution involves forming a display device with a first substrate that includes a plurality of signal lines and inspection pads, where a switch element, such as a thin film transistor, is used to share control signals between adjacent signal lines, reducing the number of inspection pads required by using a gate voltage pad to control the switch element and dividing signal lines under the inspection pads to enable efficient signal input during inspection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Area of stationary object
If the number of inspection pad electrodes is reduced to fit limited area, then the area utilization is improved, but the probing precision deteriorates
Solution Approach 1:
Multiple inspection pad electrodes are merged into a single shared inspection pad by using switch elements to selectively connect different signal lines to the same pad during different inspection phases, allowing one pad to serve multiple functions
Solution Approach 2:
The inspection pad configuration is made dynamic through switch elements that can change connections between signal lines and the inspection pad based on inspection requirements, allowing the same physical pad to represent different signal lines at different times
2Area of stationary object
If the pitch between inspection pad electrodes is reduced to fit limited area, then the area utilization is improved, but the inspection throughput deteriorates
Solution Approach 1:
Multiple inspection pad electrodes are merged into a single shared inspection pad by using switch elements to selectively connect different signal lines to the same pad during different inspection phases, allowing one pad to serve multiple functions
Solution Approach 2:
The inspection pad configuration is made dynamic through switch elements that can change connections between signal lines and the inspection pad based on inspection requirements, allowing the same physical pad to represent different signal lines at different times
3Reliability
If multiple control signals are input to the integrated circuit during inspection, then the inspection completeness is improved, but the device complexity increases
Solution Approach 1:
A single inspection pad is designed to perform multiple functions by being dynamically connected to different signal lines through switch elements, allowing one pad to input multiple different control signals during different inspection phases
Solution Approach 2:
The inspection pad configuration is made dynamic through switch elements that can change connections between signal lines and the inspection pad based on inspection requirements, allowing the same physical pad to represent different signal lines at different times
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach effectively reduces the number of inspection pads needed, improving inspection throughput and reducing costs by simplifying the inspection process while maintaining precision, even when multiple control signals are required.
Implementation Method 1
the second signal line is connected to the inspection pad through a switch element, and at the time of inspection, the switch element turns on
Data Source
AI summary
Inspection pads are reduced when there is a need to input a plurality of control signals as inspection control signals. A display device includes: an integrated circuit; a first substrate on which a plurality of signal lines that respectively input the control signals to the integrated circuit, and an inspection pad are formed; and a driver circuit that that is mounted on the first substrate and connected to the plurality of signal lines. The plurality of signal lines include first and second signal lines adjacent to each other. The inspection pad is formed on the one signal line. The second signal line is connected to the inspection pad through a switch element. At the time of inspection, the switch element turns on, and the same control signal is input to the first and second signal lines from the inspection pad.


