Inspection System Dynamic Condition Adjustment for Defect Detection
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Solution Overview
Problem
Current inspection systems fail to accurately detect appearance defects in products before shipment, leading to wasted machining costs and additional costs for rework, as defects may not be revealed until subsequent inspection steps.
Innovation Solution
An inspection system that captures images of workpieces using an image capturing unit and a processing unit to determine defects, extracts defective portions from initial and subsequent images, and adjusts inspection conditions based on these findings to enhance detection accuracy.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If multiple inspection steps are performed sequentially, then defect detection capability is improved, but machining cost increases due to wasted processing and rework
Solution Approach 1:
The system performs preliminary defect detection by analyzing images from earlier inspection steps before completing all machining operations. By extracting defective portion candidates from initial inspection images and comparing them with subsequent inspection results, the system identifies defects early in the process, allowing unnecessary machining operations to be avoided and reducing wasted machining costs.
Solution Approach 2:
The system establishes a feedback mechanism where defect detection results from subsequent inspection steps are fed back to evaluate and adjust the inspection conditions of preceding steps. This feedback loop enables continuous improvement of inspection accuracy and allows for dynamic adjustment of inspection parameters based on actual defect patterns observed in later stages.
2Measurement precision
If inspection conditions of preceding steps are optimized based on subsequent defect findings, then defect detection accuracy is improved, but system complexity increases
Solution Approach 1:
The management apparatus serves multiple functions: it stores images from different inspection steps, extracts defective portion candidates, compares images across inspection steps, determines defect presence, and adjusts inspection conditions. By consolidating these diverse functions into a single multi-functional system, the patent reduces overall system complexity while maintaining improved defect detection accuracy through integrated image processing and condition adjustment capabilities.
Data Source
AI summary
An inspection system includes an image capturing unit configured to capture an image of a workpiece, and a processing unit configured to determine quality of the workpiece based on the image captured by the image capturing unit, wherein the processing unit determines whether the workpiece includes a defect based on a second image captured by the image capturing unit in a second inspection step, wherein the processing unit extracts a defective portion candidate of the workpiece based on the second image and a first image captured by the image capturing unit in a first inspection step performed before the second inspection step, and wherein the processing unit changes an inspection condition of the first inspection step based on the extracted defective portion candidate of the workpiece.