Automated Inspection System with Parameter Determination for Power Reduction

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Existing automatic inspection systems for meters, such as flow and power meters, face challenges in reducing power consumption and measurement time due to environmental disturbances like sunlight, which affect optical sensor adjustments, leading to increased power usage in exposure adjustments.

Innovation Solution

An automatic inspection system with a measurement device that includes a sensor unit, parameter management unit, and data collection device, where the data collection device generates parameter determination information to set exposure parameters for the measurement device, reducing the time required for exposure adjustments and thus lowering power consumption.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If exposure adjustment is repeatedly performed to adapt to environmental changes, then measurement accuracy is improved, but power consumption increases

Engineering Contradiction:
Improvemeasurement accuracyVSAvoidpower consumption
Core Design Contradiction:
Measurement precisionVSUse of energy by moving object

Solution Approach 1:

The system performs preliminary exposure adjustment based on environmental light conditions before actual measurement begins. The control unit adjusts exposure parameters in advance according to detected ambient light levels, so that when measurement starts, the optimal exposure is already set, avoiding repeated adjustments during measurement and reducing power consumption while maintaining accuracy

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The measurement device autonomously monitors environmental light conditions and automatically adjusts exposure parameters without requiring repeated manual or system-wide adjustments. The device serves itself by detecting environmental changes and self-correcting exposure settings, reducing the frequency of adjustments and thereby lowering power consumption while maintaining measurement precision

Inventive Principle:
Principle #25Self-service

2Measurement precision

If exposure adjustment processing is performed to adapt to environmental conditions, then measurement accuracy is improved, but measurement time increases

Engineering Contradiction:
Improvemeasurement accuracyVSAvoidmeasurement time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

Exposure parameters are adjusted in advance based on environmental light conditions before the measurement process begins. By pre-setting the optimal exposure according to ambient light levels detected prior to measurement, the system eliminates the need for time-consuming exposure adjustments during the actual measurement, thus maintaining accuracy while reducing measurement time

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The system performs exposure adjustment periodically based on environmental changes rather than continuously or repeatedly during each measurement. By monitoring light conditions and adjusting exposure only when environmental changes warrant it, the system maintains measurement accuracy while minimizing the frequency of adjustments and reducing overall measurement time

Inventive Principle:
Principle #19Periodic action

Data Source

PatentUS11276155B2Automated inspection system and automated inspection method including a data collection device that generates exposure parameter determination information
Publication Date: 2022.03.15 HITACHI LTD
  • US11276155B2 patent drawing
  • US11276155B2 patent drawing
  • US11276155B2 patent drawing

AI summary

There are provided an automatic inspection system and an automatic inspection method capable of suppressing power consumption of a measurement device. A measurement device includes a sensor unit 11 that measures an inspection target 3, a parameter management unit 13 that determines a predetermined parameter set for the sensor unit based on parameter determination information received from a data collection device 2, and a measurement data generation unit 12 that generates measurement data by analyzing data obtained by the sensor unit measuring the inspection target by using the predetermined parameter. The data collection device includes a parameter determination information generation unit 23 that generates parameter determination information, and a measurement data acquisition unit 21 that specifies the parameter determination information for the measurement device, requests the measurement device to acquire the measurement data, and stores the measurement data acquired from the measurement device.