Inspection TFTs for Parallel Conductive Lines in OLED Displays
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Solution Overview
Problem
Existing organic light emitting display apparatuses face challenges in efficiently inspecting and identifying electrical failures, particularly short failures between conductive lines, which complicates the detection and repair process.
Innovation Solution
The implementation of parallel conductive lines and inspection thin film transistors (TFTs) adjacent to these lines allows for a two-stage inspection process, where the first stage identifies potential failures and the second stage isolates the specific line causing the issue, enabling precise detection and repair.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional inspection methods are used without inspection TFTs, then the device structure remains simple, but electrical failures cannot be precisely identified and inspected
Solution Approach 1:
The invention divides the inspection function into separate inspection TFTs that are distinct from the driving TFTs. Each inspection TFT is associated with specific conductive lines (scan lines, emission control lines, power lines) to enable targeted inspection of electrical failures in those lines, thereby achieving precise failure identification without requiring complete structural redesign
Solution Approach 2:
The inspection TFTs serve as intermediary components between the conductive lines and the inspection apparatus. These TFTs enable the inspection apparatus to apply inspection voltages and measure currents through the conductive lines without directly interfering with the normal display operation, thus achieving precise electrical failure detection while maintaining device functionality
2Reliability
If parallel conductive lines are used to improve signal transmission, then transmission reliability improves, but it becomes difficult to identify which specific line has a failure
Solution Approach 1:
The invention assigns dedicated inspection TFTs to each parallel conductive line or group of lines. By controlling individual inspection TFTs independently, the system can isolate and inspect each line separately to identify which specific line has a failure, thereby maintaining transmission reliability through parallel lines while enabling precise failure location detection
Solution Approach 2:
The inspection apparatus applies inspection voltages to conductive lines through inspection TFTs and measures the resulting currents. The measured current values provide feedback information about the electrical state of each line, enabling the system to identify lines with failures (abnormal current values) while maintaining the parallel line structure for reliable signal transmission
Data Source
AI summary
An organic light emitting display apparatus and a method of inspecting the same, the organic light emitting display apparatus including a plurality of sub-pixels; a plurality of conductive line portions connected to the sub-pixels, the plurality of conductive line portions including at least two conductive lines connected in parallel to one another; and inspection thin film transistors (TFTs) disposed adjacent to one end and both ends of at least one conductive line of the conductive lines connected in parallel to one another.