Instrument Classification Mapping Using IEC 61987 Characteristics
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Solution Overview
Problem
Current instrument classification systems in industrial facilities face challenges in efficiently mapping individual instruments to standardized classification symbols, particularly in complex industrial management systems, leading to increased administrative workload and potential omissions during instrument additions or replacements.
Innovation Solution
An instrument classification symbol specifying device that acquires and processes instrument information using standardized information models, such as IEC 61987, to automatically determine and display appropriate classification symbols by associating instrument characteristics with their measurement or control targets, reducing manual effort and errors.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If manual mapping of instruments to classification symbols is performed, then flexibility and accuracy in classification can be maintained, but administrative workload increases and errors may occur during instrument additions or replacements
Solution Approach 1:
The system enables automatic self-classification of instruments by extracting instrument information from existing industrial management systems and automatically determining classification symbols, eliminating the need for manual administrative intervention while maintaining classification accuracy
Solution Approach 2:
The patent replaces the manual mechanical process of classification mapping with an automated information processing system that extracts instrument data and determines classification symbols through computational methods, significantly reducing administrative workload
2Productivity
If automatic classification determination is implemented, then administrative workload is reduced, but complexity of the classification system increases
Solution Approach 1:
The system introduces an intermediary classification determination unit that bridges instrument information and classification symbols, automatically processing the mapping while managing system complexity through modular architecture that integrates with existing industrial management systems
3Measurement precision
If comprehensive instrument information is processed for accurate classification, then classification precision improves, but processing time and computational resources increase
Solution Approach 1:
The system extracts only the necessary classification-relevant information from comprehensive instrument data, filtering out unnecessary details while maintaining classification precision through targeted information extraction from instrument specifications and operational parameters
Data Source
AI summary
An instrument classification symbol specifying device includes a processor coupled to a memory. The processor acquires instrument information and a standardized information model. The processor specifies characteristics of an instrument on the basis of the instrument information. The processor determines an instrument classification symbol corresponding to the instrument on the basis of: determination information in which the characteristics of the instrument are associated with the instrument classification symbol, and the specified characteristics of the instrument. When the processor succeeds in specifying the characteristics of the instrument, the processor outputs a result of mapping between the instrument and the instrument classification symbol. When the processor has difficulty in specifying the characteristics of the instrument, the processor causes a display device to display candidates of the characteristics of the instrument.