Instrument Position Data Generation Using Multi-Sensor Deformation Compensation
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Solution Overview
Problem
Existing methods struggle to accurately determine the position of instruments that deform or warp during use, as they cannot differentiate between position data and interfering signals, especially in applications where instruments are flexible and subject to bending.
Innovation Solution
A method involving at least two sections with sensors, where the position of one section is mathematically determined relative to the other using stored data and mathematical equations, considering geometry, material properties, and ambient factors, to account for deformations and distinguish between actual and interfering signals.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If optical measuring principles are used to determine instrument position, then measurement precision is improved for rigid instruments, but reliability deteriorates when instruments deform or warp during use
Solution Approach 1:
The patent applies dynamics by transitioning from static position measurement to dynamic deformation tracking. The system continuously monitors changes in sensor positions relative to each other as the instrument deforms, using mathematical models to distinguish between intentional position changes and deformation-induced position changes. This allows the system to maintain reliability by adapting to the dynamic nature of flexible instrument deformation during use.
Solution Approach 2:
The patent implements feedback by using multiple sensors to continuously monitor the instrument's configuration and feeding this information back to a control unit. The control unit processes the sensor data to determine actual instrument position while compensating for deformation effects. This closed-loop feedback mechanism enables the system to maintain accurate position determination despite the instrument's flexible, deformable nature.
2Measurement precision
If multiple sensors are used on deformable instruments to track position, then measurement precision is improved, but device complexity increases due to the need for deformation compensation
Solution Approach 1:
The patent applies segmentation by dividing the instrument into multiple sections, each equipped with sensors. This segmentation allows the system to independently measure deformation in each section and reconstruct the overall instrument configuration through mathematical modeling. The segmented approach simplifies the complexity by breaking down the complex deformation problem into manageable local measurements that can be processed independently and then integrated.
Solution Approach 2:
The patent replaces complex mechanical deformation compensation mechanisms with mathematical models and computational algorithms. Instead of using additional mechanical components to physically compensate for deformation, the system uses software-based mathematical relationships to calculate and correct position data. This substitution dramatically reduces device complexity while maintaining measurement precision.
3Adaptability or versatility
If instruments are made flexible to improve adaptability in confined areas, then adaptability is improved, but measurement precision deteriorates due to deformation and warping
Solution Approach 1:
The patent introduces mathematical models and computational algorithms as intermediaries between the flexible instrument and the position measurement system. These intermediaries process the raw sensor data from the flexible instrument, separate deformation effects from intentional position changes, and produce accurate position information. The intermediary layer enables the system to maintain measurement precision while allowing the instrument to remain flexible and adaptable.
Solution Approach 2:
The patent changes the measurement parameters from absolute position to relative position changes between sensors. By monitoring how sensor positions change relative to each other rather than measuring absolute position directly, the system can distinguish between deformation (which causes relative position changes) and intentional instrument movement (which causes coordinated position changes). This parameter transformation enables accurate measurement on flexible instruments.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach allows for precise determination of instrument position and deformation, reducing interference from external factors and improving accuracy in applications like medical instruments, where precise navigation is critical.
Implementation Method 1
A field generator which is arranged in spatial proximity of the instrument generates an electromagnetic field which induces electric potential in the coil elements of the instrument according to the law of electromagnetic induction (induction law)
Data Source
AI summary
A method for detecting deformations and errors and/or for generating position data of an instrument (1) with at least one first section (2) with at least one first sensor (4) and at least one second section (3) with at least one second sensor (5), wherein the method encompasses metrologically determining the position of the first and second sensor (4, 5). The method encompasses mathematically determining the position of the second sensor (5) with regard to the first section (2), preferably in at least two ways. Further, an apparatus for executing the method is specified.