Integrated Circuit Board Testing Apparatus
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Solution Overview
Problem
Conventional testing methods for printed circuit boards require separate equipment and test stations for ICT and SA function tests, leading to increased costs, manpower, and time, as well as inefficiencies due to the lack of integrated test interfaces.
Innovation Solution
A testing apparatus with a modular design comprising a control unit, signal generation unit, signal processing unit, power supply unit, test address assignment unit, and signal isolation unit, allowing for simultaneous execution of ICT and SA function tests on the same platform through a signal transmission line, reducing the need for multiple test stations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If separate test stations are used for ICT and SA function tests, then testing coverage is improved, but equipment cost and manpower cost increase
Solution Approach 1:
The patent combines ICT test functions and SA function test functions into a single integrated test station. The test platform includes both ICT test interfaces and SA test interfaces, allowing both types of tests to be performed on the same equipment, thereby reducing equipment cost and manpower cost while maintaining comprehensive testing coverage.
Solution Approach 2:
The test platform is designed with multi-functionality to perform both ICT tests and SA function tests. The system includes configurable test interfaces that can adapt to different test types, making a single piece of equipment capable of handling multiple testing requirements that previously required separate specialized stations.
2Reliability
If separate test stations are used for ICT and SA function tests, then testing coverage is improved, but testing time increases
Solution Approach 1:
The integrated test platform enables continuous testing by eliminating the need to transfer the circuit board between separate test stations. Both ICT and SA function tests can be performed in sequence on the same platform without interruption, reducing total testing time while maintaining comprehensive test coverage.
3Measurement precision
If separate test stations are used for ICT and SA function tests, then test specialization is improved, but test efficiency decreases
Solution Approach 1:
The integrated test platform maintains functional segmentation by providing separate test interfaces and test programs for ICT and SA function tests. Each test type retains its specialized testing capabilities through dedicated interfaces, while the overall system integrates these functions to improve efficiency by eliminating equipment transfers and enabling streamlined testing workflows.
Data Source
AI summary
The present disclosure provides a testing apparatus for executing a test program, to perform a first test on a circuit component on a circuit board and a second test on the circuit board. The testing apparatus includes a first module, a second module, and a signal transmission line that connects the two. The first module includes a control unit, a signal generation unit, a signal processing unit, a signal expansion unit, and a power supply unit. The control unit generates a first control signal or a second control signal. The signal generation unit generates a current signal or a voltage signal. The signal processing unit generates a numerical signal. The signal expansion unit generates a second data signal. The power supply unit generates a working voltage. The second module includes a test address assignment unit that assigns an address and a signal isolation unit that performs noise immunization process.