Integrated Clock and Power Distribution Network

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Solution Overview

Problem

The performance of semiconductor devices is hindered by poor distribution of power and clock signals, leading to reduced frequency and increased power dissipation due to mismatched devices and wires, with wire propagation delay accounting for half of the total clock distribution delay.

Innovation Solution

An integrated clock and power distribution network is created using a full-dense-mesh configuration on top metal layers with a low impedance underpass on the next metal layer, employing an orthogonal placement grid and bow tie elements to minimize delay and skew, and integrate clock and power distribution structures.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If separate clock and power distribution networks are used, then design flexibility is maintained, but area overhead increases and performance is degraded

Engineering Contradiction:
Improvedevice performanceVSAvoiddistribution network structure
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The patent merges the clock distribution network and power distribution network into a single integrated structure where clock signals and power signals share the same distribution pathways and routing infrastructure, eliminating the need for separate networks and reducing overall complexity while improving performance

Inventive Principle:
Principle #5Merging (Combining)

2Loss of time

If conventional clock distribution is used, then implementation is simple, but wire propagation delay accounts for half of total clock distribution delay

Engineering Contradiction:
Improveclock distribution delayVSAvoiddistribution network implementation
Core Design Contradiction:
Loss of timeVSEase of manufacture

Solution Approach 1:

The patent transitions from traditional two-dimensional planar clock distribution to a three-dimensional vertical distribution architecture utilizing multiple metal layers, where clock signals propagate through stacked conductive layers to reduce horizontal wire lengths and propagation delays

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Productivity

If top metal layers are used for distribution, then wire resources are optimized, but power distribution quality may be compromised

Engineering Contradiction:
Improvewire resource optimizationVSAvoidpower distribution quality
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The patent employs a composite distribution structure combining multiple metal layers with different electrical characteristics, where top metal layers optimized for signal distribution work in conjunction with lower metal layers optimized for power delivery, creating a hybrid network that achieves both wire resource efficiency and power distribution quality

Inventive Principle:
Principle #40Composite materials

Data Source

PatentUS7847408B2Integrated clock and power distribution
Publication Date: 2010.12.07 ORACLE AMERICAN INC
  • US7847408B2 patent drawing
  • US7847408B2 patent drawing
  • US7847408B2 patent drawing

AI summary

An integrated clock and power distribution network in a semiconductor device includes assigning a first tile to a location on a placement grid corresponding to a top metal layer. An orientation is assigned to the first tile relative to the top metal layer placement grid. The first tile is placed on a representation corresponding to the top metal layer in accordance with the assignments. A second tile is assigned to a location on a placement grid corresponding to a top-1 metal layer. The orientation is assigned to the second tile relative to the top-1 metal layer placement grid. The second tile is placed on a representation corresponding to the top-1 metal layer in accordance with the assignments. The first and second tile are arranged as a full-dense-mesh distribution structure. The first tile includes an integrated clock and power distribution structure. The second tile includes a low impedance underpass structure.