Integrated Latch Control for 3D Measuring Machine Accuracy
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Conventional measurement devices experience time lags and reduced measurement accuracy due to separate latch control mechanisms for scale and touch counters, leading to longer processing times and unreliable coordinate readings.
Innovation Solution
Integration of touch and scale counters within a single integrated circuit on the control circuit board allows simultaneous latch control, eliminating the need for separate register readings and enabling faster, more accurate measurement processing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If separate latch control mechanisms are used for scale and touch counters, then each counter can be controlled independently, but time lags occur between latch timing and measurement accuracy declines
Solution Approach 1:
The patent merges the previously separate latch control mechanisms for the scale counter and touch counter into a single integrated latch control unit. This integration ensures that both counters are latched simultaneously at the same timing moment, eliminating the time lag that occurred when separate software-based latch controls operated independently. The unified latch control reads both counter values in one operation, improving both reliability and reducing processing time.
2Productivity
If separate latch control mechanisms are used for scale and touch counters, then individual control is possible, but measurement processing time increases
Solution Approach 1:
The patent combines multiple latch control functions into a single integrated latch control unit that simultaneously manages both the scale counter and touch counter. This merging reduces the overall complexity by eliminating redundant separate control mechanisms while improving productivity through simultaneous latching operations that reduce measurement processing time.
Solution Approach 2:
The integrated latch control unit performs multiple functions: it latches both the scale counter and touch counter values simultaneously, manages coordinate detection signals, and handles touch detection signals within a single control mechanism. This multi-functionality reduces device complexity while maintaining or improving measurement processing speed.
3Adaptability or versatility
If separate circuit bodies are used for probe circuit and scale circuit, then interchangeability of probes is enabled, but latch timing synchronization becomes difficult
Solution Approach 1:
The patent integrates the latch control functionality into a unified control circuit board that receives signals from both the interchangeable probe circuit and the scale circuit. This merging ensures that even though the probe circuit and scale circuit remain separate to maintain interchangeability, their latch timing is synchronized through the integrated control mechanism, preserving measurement precision.
Data Source
AI summary
A three-dimensional measuring machine (measurement device) which supplies a probe having a measurement head able to make contact with a measured object and a contact detection sensor which detects the contact of a measurement head with a measured object and outputs a touch signal; a displacement structure which displaces a probe along three axial directions orthogonal to one another; scale sensors which detect the position coordinates of a probe and output a coordinate detection signal; a control circuit board having an integrated circuit on which are installed a touch counter which counts touch signals and a scale counter which counts coordinate detection signals; and a latch controller which latches a touch counter value and a scale counter value at the same time.