Integrated Communication Link Tester for Precision Signal Testing
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Solution Overview
Problem
Current precision testing of electronic devices requires a collection of expensive and disparate equipment, leading to issues such as non-repeatability of measurements, lack of timing coordination, excessive power consumption, and complexity in software integration.
Innovation Solution
A single, integrated communication link tester that combines a high-precision signal output generator with a high-precision signal receiver, enabling real-time analysis and synchronization of signals, and minimizing power usage through shared components.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If multiple disparate precision testing equipment are used, then measurement precision can be maintained, but measurement repeatability deteriorates due to system variations
Solution Approach 1:
The patent combines multiple separate precision testing instruments (AWG, BERT, oscilloscope) into a single integrated test system. This integration eliminates variations introduced by multiple independent devices, cables, and connections, thereby improving measurement repeatability while maintaining the precision capabilities of each individual component through their combined functionality.
Solution Approach 2:
The integrated test system performs multiple testing functions (arbitrary waveform generation, bit error rate testing, oscilloscope measurements) within a single universal platform. This multi-functionality allows the system to maintain various measurement precision requirements while eliminating the need for multiple disparate devices that would otherwise introduce variability.
2Adaptability or versatility
If multiple separate equipment are used in test assembly, then functional versatility is improved, but device complexity increases
Solution Approach 1:
The patent merges multiple separate testing devices into one integrated system, reducing the overall complexity of the test assembly. Instead of managing multiple independent instruments with separate power supplies, control interfaces, and connection cables, the integrated system provides a unified platform that simplifies setup and operation while maintaining functional versatility.
Solution Approach 2:
The integrated test system achieves functional versatility through a universal platform that can perform multiple testing functions (waveform generation, error rate testing, signal analysis) within a single device. This eliminates the need for multiple specialized instruments, thereby reducing device complexity while preserving adaptability.
3Measurement precision
If multiple independent devices are used, then measurement precision is maintained, but timing coordination deteriorates
Solution Approach 1:
The patent combines multiple timing-critical functions (waveform generation, signal transmission, error rate measurement) into a single integrated system with a unified clock reference. This eliminates timing coordination issues that arise from synchronizing multiple independent devices, as all components now operate from a common time base without synchronization delays or drift.
4Reliability
If each device operates independently with peak power supply, then device reliability is improved, but power consumption increases
Solution Approach 1:
The patent merges the power supply systems of multiple independent devices into a single shared power source for the integrated test system. Instead of each device drawing peak power independently, the unified power supply optimizes energy distribution across all functions, reducing total power consumption while maintaining the reliability needed for precision measurements.
Data Source
AI summary
A test and measurement device includes an input configured to receive an analog signal from a Device Under Test (DUT), an Analog to Digital Converter (ADC) coupled to the input and structured to convert the analog signal to a digital signal, a receiver implemented in a first Field Programmable Gate Array (FPGA) and structured to accept the digital signal and perform signal analysis on the digital signal, a transmitter implemented in a second FPGA and structured to generate a digital output signal, and a Digital to Analog Converter (DAC) coupled to the transmitter and structured to convert the digital output signal from the transmitter to an analog signal, and structured to send the analog signal to the DUT. The receiver and the transmitter are coupled together by a high speed data link over which data about the current testing environment may be shared.