Integrated Measuring Probe for Vector Network Analysis
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Solution Overview
Problem
Contactless vector network analysis systems face challenges in accurately measuring scattering parameters of RF or microwave components embedded in circuits due to limitations in probe positioning and dynamic range, particularly when components have high input impedance or excessive attenuation.
Innovation Solution
A measuring probe with a contactless conductor loop or combined inductive and capacitive probe design, including an additional signal probe for direct electrical and mechanical contact, impedance-controlled coupling, and integrated amplifiers, allows for precise measurement of scattering parameters by feeding the signal directly upstream or downstream of the device under test, reducing noise and improving dynamic range.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If contactless loop-type probes are used for measuring scattering parameters, then measurement precision is improved, but device complexity increases due to positioning difficulties and limited dynamic range
Solution Approach 1:
The patent combines a contactless loop-type probe with a contact prod probe into a single integrated measuring device. The contactless probe provides electromagnetic coupling for non-contact measurement, while the contact prod provides direct electrical contact for signal injection and extraction. This merging resolves the contradiction by maintaining measurement precision through the contactless element while simplifying device complexity through the integrated contact element that enables straightforward signal delivery without complex positioning mechanisms.
Solution Approach 2:
The integrated probe serves multiple functions simultaneously: the contactless loop element performs electromagnetic coupling and directionality functions, while the contact prod element provides signal injection, extraction, and reference functions. This multi-functionality allows the single device to handle various measurement scenarios including high input impedance components and components with excessive attenuation, thereby improving measurement precision without proportionally increasing device complexity.
2Ease of operation
If conventional contactless probes are used, then ease of operation is improved, but measurement precision deteriorates due to noise and limited dynamic range
Solution Approach 1:
The patent merges contactless and contact-based probe elements into a single integrated device. The contactless loop element maintains ease of operation by enabling non-contact measurement, while the contact prod element improves measurement precision by providing direct electrical contact for signal delivery, thereby reducing noise and extending dynamic range. The combination allows the system to benefit from both operational convenience and enhanced measurement precision.
Solution Approach 2:
The contact prod acts as an intermediary element between the signal source and the contactless loop probe. It provides a reliable electrical connection for signal injection and extraction, serving as a mediator that improves signal quality and dynamic range while the contactless loop element maintains ease of operation through non-contact measurement capability.
3Ease of operation
If probe is positioned far from signal line for contactless measurement, then ease of operation is improved, but measurement precision deteriorates due to increased noise and reduced coupling efficiency
Solution Approach 1:
The integrated probe combines a contactless loop element that can be positioned at convenient distances for non-contact measurement with a contact prod element that provides direct electrical contact at the signal line. This merging allows the contactless element to maintain ease of operation while the contact element ensures high coupling efficiency and signal quality through direct electrical connection, resolving the contradiction between positioning convenience and measurement precision.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate determination of full two-port scattering parameters regardless of circuit components, with improved signal quality and reduced noise, by positioning the probe optimally and using impedance-controlled coupling to maximize input return loss and minimize sheath waves.
Implementation Method 1
at least one coupling structure (12) which is designed to couple an RF signal out from a signal line (16)
Implementation Method 2
at least one additional signal probe (14) for coupling an electrical signal into the signal line (16)
Data Source
AI summary
A measuring probe, particularly for a non-contacting vector network analysis system, having a housing and at least one coupling structure disposed on the housing and designed for coupling an HF signal from a signal line, such that at least one additional signal probe is disposed on the housing for coupling an electrical signal into the signal line.