Integrated Optical Slit for In Situ Spectrometer Calibration

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Solution Overview

Problem

Spectrometers face misalignment issues due to shock, vibration, and thermal effects, which affect wavelength accuracy, and current wavelength calibration methods require additional optical components or complex setups.

Innovation Solution

An optical slit device with integrated semiconductor laser technology and micro-optics on a silicon nitride substrate, combining calibration light sources with narrow bandpass filters, allowing for in situ wavelength calibration without extra components.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If wavelength calibration light source is multiplexed into light path or connected to optical port, then wavelength calibration can be performed, but additional optical components such as fiber or integrating sphere are required

Engineering Contradiction:

Improvewavelength calibration accuracyVSAvoidnumber of optical components

Core Design Contradiction:

Measurement precisionVSDevice complexity

Solution Approach 1:

The calibration light sources are integrated directly into the optical slit structure, merging the calibration function with the existing optical component. This eliminates the need for separate calibration light sources, fibers, or integrating spheres, thereby reducing device complexity while maintaining calibration capability

Inventive Principle:

Principle #5Merging (Combining)

Solution Approach 2:

The optical slit is designed to serve multiple functions: it acts as both the entrance aperture for the spectrometer and the housing for the calibration light sources. This multi-functionality allows the same component to perform both light entry control and wavelength calibration, reducing the total number of components required

Inventive Principle:

Principle #6Universality (Multi-functionality)

2Ease of manufacture

If conventional slit fabrication using electrical discharge machining is used, then slits can be manufactured, but microelectromechanical techniques with semiconductor materials offer better integration potential

Engineering Contradiction:

Improvemanufacturing processVSAvoidintegration complexity

Core Design Contradiction:

Ease of manufactureVSDevice complexity

Solution Approach 1:

The patent replaces traditional electrical discharge machining with microelectromechanical systems (MEMS) fabrication techniques. This substitution allows the slit and calibration light sources to be manufactured as an integrated semiconductor device, improving ease of manufacture through standardized MEMS processes while enabling better integration

Inventive Principle:

Principle #28Mechanics substitution (Replace mechanical system)

3Ease of operation

If optical mechanical components are used, then spectrometer can operate, but misalignment occurs due to shock, vibration, and thermal effects

Engineering Contradiction:

Improvespectrometer operationVSAvoidwavelength accuracy stability

Core Design Contradiction:

Ease of operationVSReliability

Solution Approach 1:

By integrating the calibration light sources directly into the optical slit, the patent creates a more rigid and stable structure. This integration reduces the number of separate mechanical components that can misalign, thereby improving reliability and wavelength accuracy stability under shock, vibration, and thermal conditions

Inventive Principle:

Principle #5Merging (Combining)

Solution Approach 2:

The calibration light sources are pre-positioned and fixed within the optical slit structure during manufacturing. This preliminary positioning ensures precise alignment is maintained under varying operational conditions, preventing misalignment issues that would otherwise require frequent recalibration

Inventive Principle:

Principle #10Preliminary action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables accurate and cost-effective in situ wavelength calibration, reducing the need for additional optical components and improving instrument stability.

Implementation Method 1

An optical slit device with integrated semiconductor laser technology and micro-optics on a silicon nitride substrate, combining calibration light sources with narrow bandpass filters

Methodology Applied

Scientific EffectLight emission from semiconductor lasers: Laser

Implementation Method 2

combining calibration light sources with narrow bandpass filters

Methodology Applied

Scientific EffectOptical filtering: Filter (optical)

Implementation Method 3

integrated light enters the entrance slit (1) and is transmitted down the same optical path as a light source under test (7)

Methodology Applied

Scientific EffectLight transmission: Light

Data Source

PatentUS10302488B2Optical slit for a spectrometer that incorporates a wavelength calibration light source

Publication Date: 2019.05.28 OCEAN OPTICS INC

AI summary

An optical slit device that combines microelectromechanical design techniques, semiconductor laser technology, and micro-optics to provide a spectrometer entrance slit on a semiconductor substrate with integrated calibration light sources, which integrated light enters the entrance slit and is transmitted down the same optical path as a light source under test and by which the spectrometer can be wavelength calibrated in situ is disclosed.