Integrated Probe Head for Simultaneous Electrical and Optical Inspection
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Solution Overview
Problem
Existing connecting devices for inspecting optoelectronic devices require significant time for alignment and struggle to perform simultaneous electrical and optical measurements due to independent positioning of electric and optical contacts.
Innovation Solution
A connecting device with a probe head holding both electric and optical contacts, where the tip ends are exposed on the lower surface and proximal ends on the upper surface, and a transformer with connecting wires and optical wires that facilitate simultaneous alignment and measurement by matching the positional relationship between electrical and optical signal terminals.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If electric contacts and optical contacts are formed independently in separate units, then each contact can be optimized for its specific function, but the alignment time with the optoelectronic device increases significantly
Solution Approach 1:
The patent combines electric contacts and optical contacts into a single integrated probe head unit. The probe head holds both types of contacts in fixed positional relationships, allowing simultaneous alignment with corresponding terminals on the optoelectronic device. This eliminates the need for separate alignment operations that would be required if electric and optical contacts were in independent units, thereby reducing alignment time while maintaining functional optimization of each contact type.
2Measurement precision
If electric contacts and optical contacts are positioned independently, then each contact can be precisely positioned, but the ability to execute simultaneous electrical and optical measurements is compromised
Solution Approach 1:
The probe head integrates multiple electric contacts and optical contacts with predetermined positional relationships that correspond to the terminal arrangements on the optoelectronic device. This integration allows all contacts to be positioned and make contact simultaneously in a single operation, enabling concurrent electrical and optical measurements without sequential positioning steps, thus improving measurement execution speed while maintaining positioning accuracy.
Solution Approach 2:
The relative positions of electric contacts and optical contacts within the probe head are pre-established during manufacturing to match the terminal layout on the optoelectronic device. This preliminary configuration ensures that when the probe head is positioned, all contacts are correctly aligned with their corresponding terminals simultaneously, enabling immediate execution of both electrical and optical measurements without requiring separate positioning actions.
3Ease of manufacture
If separate units are used for electric and optical contacts, then manufacturing and assembly can be simplified, but the overall device complexity increases due to multiple independent positioning systems
Solution Approach 1:
By integrating electric and optical contacts into a single probe head with fixed internal positioning, the patent reduces the number of independent positioning systems required. The probe head acts as a unified positioning unit that handles both contact types simultaneously, simplifying the overall positioning mechanism compared to coordinating separate units. This integration maintains manufacturing simplicity for each contact type while reducing system-level complexity.
Data Source
AI summary
A connecting device for inspection includes a probe head configured to hold electric contacts and optical contacts such that tip ends of the respective contacts are exposed on a lower surface of the probe head, and a transformer including connecting wires arranged therein and optical wires penetrating therethrough. The respective proximal ends of the electric contacts and the optical contacts are exposed on an upper surface of the probe head, and tip ends on one side of the connecting wires electrically connected to the proximal ends of the electric contacts and connecting ends of the optical wires optically connected to the proximal ends of the optical contacts are arranged in a lower surface of the transformer. A positional relationship between the tip end of the respective electric contacts and the tip end of the respective optical contacts on the lower surface of the probe head corresponds to a positional relationship between an electrical signal terminal and an optical signal terminal of a semiconductor device.