Integrated Probe Mounting for Rotating Machine Monitoring

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Solution Overview

Problem

Existing machines with detecting probes for rotating members face high downtime and complexity during servicing and replacement, necessitating a solution to reduce these issues while maintaining accurate monitoring.

Innovation Solution

A detecting probe mounting device with a two-parted configuration, featuring a probe support structure with threaded holes and mounting means, allowing for easy access and positioning of multiple probes, which can be removed as a single unit for servicing and replacement, reducing the need for precise alignment and adjustment.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If detecting probes are mounted individually in the casing, then precise positioning and alignment can be achieved, but the downtime for servicing and replacing probes increases significantly

Engineering Contradiction:
Improvepositioning precisionVSAvoiddowntime
Core Design Contradiction:
Manufacturing precisionVSLoss of time

Solution Approach 1:

Multiple detecting probes are merged into a single integrated detecting probe device that can be removed and installed as one unit. The device includes a support structure with multiple probes positioned at predetermined locations, allowing simultaneous replacement of all probes without individual alignment operations.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The detecting probes are pre-positioned and pre-aligned during the manufacturing of the integrated device. This preliminary action ensures that when the device is installed in the casing, the probes are already at their correct positions and orientations, eliminating the need for time-consuming alignment operations during maintenance.

Inventive Principle:
Principle #10Preliminary action

2Measurement precision

If multiple detecting probes are used to improve measurement accuracy, then the complexity of handling and replacing individual sensors increases

Engineering Contradiction:
Improvemeasurement accuracyVSAvoidhandling complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

Multiple detecting probes are combined into a single integrated device with a common support structure. This merging reduces handling complexity because the entire multi-probe assembly can be manipulated as one unit rather than handling multiple separate sensors, while still providing improved measurement accuracy through multiple probes.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The integrated detecting probe device serves multiple functions simultaneously - it can monitor multiple parameters (vibration, temperature, pressure) and can be installed/removed as a single universal unit that replaces multiple individual probes, simplifying maintenance procedures while maintaining comprehensive monitoring capabilities.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentEP2707642B1Detecting probe mounting device
Publication Date: 2016.11.16 SIEMENS AG
  • EP2707642B1 patent drawingFigure 1
  • EP2707642B1 patent drawingFigure 2
  • EP2707642B1 patent drawingFigure 3

AI summary

The invention relates to a detecting probe mounting device (10) for fixation in the proximity to a rotating member (110) of a machine (100), comprising at least two detecting probes (20) with a connecting part (22) and a detecting part (24) for detecting parameters of the machine (100) and/or the rotating member (110), a probe support structure (30) with one through hole (32) for each detecting probe (20) and with mounting means (34) for mounting each detecting probe (20) at the probe support structure (30), wherein in a mounted state the connecting part (22) and the detecting part (24) are located on different sides of each through hole (32), and fixing means (40) for fixing the probe support structure (30) at a predefined position in proximity to the rotating member (110) of the machine (100), wherein in the fixed state the detecting part (24) of each detecting probe (20) is facing the rotating member (110).