Integrated Probe Assembly for Sliding-Free Weld Seam Detection
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Solution Overview
Problem
Current welding quality detection methods, such as resistance testing, face issues with single-channel detection causing surface scratches, low efficiency, and low reliability due to the need for probe sliding, which results in deformation and slow detection speeds, making them unsuitable for high-efficiency production.
Innovation Solution
A quality detection device with an integrated probe set and modules that form a current loop across the welded seam, allowing for simultaneous scanning without probe sliding, reducing surface roughness requirements and enhancing detection reliability and speed.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If probe sliding detection is used to test welded seam quality, then the detection can cover the whole welded seam, but the probes cause surface scratches and deformation, reducing reliability and efficiency
Solution Approach 1:
The patent replaces the mechanical sliding probe system with an electromagnetic detection system. Current is driven through the welded seam between two driving probes, and voltage is collected by collecting probes, forming an electrical measurement system that eliminates mechanical contact and sliding, thereby preventing surface scratches and probe deformation while maintaining detection accuracy
Solution Approach 2:
The patent introduces electrical current as an intermediary to perform the detection function. Instead of mechanically sliding probes to detect resistance variations, the system uses current flow through the welded seam and measures voltage drops, allowing quality detection without physical contact that causes damage
2Area of stationary object
If four parallel probes slide simultaneously to detect whole welded seam resistance, then detection coverage is improved, but detection speed decreases and efficiency is reduced
Solution Approach 1:
The patent enables continuous detection by having multiple probe pairs work simultaneously rather than sequentially. Multiple driving probe-collecting probe combinations operate in parallel, allowing the entire welded seam to be detected at once, eliminating the time loss associated with sequential sliding detection and significantly improving detection efficiency
3Measurement precision
If probes are used for resistance testing, then welded seam quality can be detected, but surface roughness requirements become very high, generating abnormal values
Solution Approach 1:
The patent replaces mechanical sliding contact with electrical contact through the workpiece. Current is driven through the welded seam and voltage is measured by collecting probes, eliminating the need for smooth surface contact and reducing sensitivity to surface roughness, thereby reducing abnormal detection values caused by surface conditions
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution enables rapid, high-efficiency detection of welded seam quality with reduced surface damage and increased reliability, suitable for large-batch production, while maintaining stability and avoiding pollution.
Implementation Method 1
The driving module is configured to release current to form a current loop with a conductor, wherein the driving ends abut against the conductor
Implementation Method 2
two probes in an inner side are set as collecting probes on two sides of the welded seam to collect voltage variation of the two sides of welded seam, and welded seam resistance is calculated
Data Source
AI summary
The present disclosure relates to a welding quality detecting field, and specifically relates to a quality detection device. The quality detection device includes an integrated probe set, a driving module and a collecting module. The integrated probe set includes a plurality of integrated probe assemblies. The integrated probe assemblies are disposed in pairs and each integrated probe assembly includes a driving end and a collecting end. The driving end of one integrated probe assembly is matched with the driving end of another integrated probe assembly disposed in pairs with the one integrated probe assembly. The collecting end of one integrated probe assembly is matched with the collecting end of another integrated probe assembly disposed in pairs with the one integrated probe assembly.


