Integrated Test System Merging Pre-Qualifying and Functional Testing
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Solution Overview
Problem
Conventional electronic testing approaches are expensive, labor-intensive, and inefficient due to the need for separate systems for pre-qualifying and functional testing, requiring physical manipulation of devices under test, which disrupts testing operations and increases costs.
Innovation Solution
A test system integrating pre-qualifying and functional test components with a controller and switch, allowing for automatic selection and performance of different testing procedures, including Bit Error Rate Testing (BERT) and functional testing, without physically moving devices between systems, and maintaining environmental control.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If separate dedicated pre-qualifying test equipment and functional testers are used, then testing reliability is improved, but device complexity and cost increase
Solution Approach 1:
The patent combines pre-qualifying test equipment and functional testers into a single integrated test system. The test head includes both BERT (Bit Error Rate Testing) components for pre-qualifying testing and functional test components, allowing both testing types to be performed on the same device without requiring separate dedicated equipment, thereby reducing system complexity while maintaining testing reliability
Solution Approach 2:
The test system is designed with multi-functionality to perform both pre-qualifying testing (BERT) and functional testing through a single test head. The switch matrix and controller enable the same physical test equipment to be configured for different testing modes, eliminating the need for separate dedicated equipment and reducing overall system complexity
2Reliability
If devices are physically moved between separate test systems, then comprehensive testing is achieved, but productivity decreases
Solution Approach 1:
By merging pre-qualifying and functional testing capabilities into a single integrated test system, the patent eliminates the need to physically move devices between separate test systems. The unified test head with switch matrix allows comprehensive testing (both BERT and functional tests) to be performed in-place, significantly improving productivity by removing manual handling steps and maintaining continuous testing operations
Solution Approach 2:
The integrated test system enables continuous testing operations by eliminating interruptions caused by physical device movement. The controller can seamlessly switch between BERT mode and functional test mode without requiring device removal or system reconfiguration, maintaining continuous useful action and maximizing testing throughput
3Measurement precision
If manual population and manipulation of devices is performed, then testing accuracy is maintained, but labor intensity increases
Solution Approach 1:
The test system incorporates automated device population capabilities where devices are automatically loaded onto the loadboard and connected to the test head without manual intervention. The automated handling maintains testing accuracy through consistent, controlled positioning while eliminating the labor-intensive manual population and manipulation steps, significantly improving ease of operation
Solution Approach 2:
The patent replaces manual mechanical manipulation of devices with automated electronic switching and control systems. The switch matrix and controller automatically route signals and configure testing parameters, substituting manual mechanical operations with automated electronic control that maintains precision while reducing labor intensity
4Ease of operation
If environmental chamber is opened for device manipulation, then device access is enabled, but environmental control is lost
Solution Approach 1:
The integration of pre-qualifying and functional testing in a single test system allows device access and configuration to be performed without opening the environmental chamber. The unified test head with electronic switching enables all necessary testing operations to be conducted through the closed chamber interface, maintaining both ease of operation and environmental control simultaneously
Data Source
AI summary
Presented embodiments facilitate efficient and effective flexible implementation of different types of testing procedures in a test system. In one embodiment, a test system comprises pre-qualifying test components, functional test components, a controller, a transceiver, and a switch. The pre-qualifying test components are configured to perform pre-qualifying testing on a device under test. The functional test components are configured to perform functional testing on the device under test. The controller is configured to direct selection between the pre-qualifying testing and functional testing. The transceiver is configured to transmit and receive signals to/from the device under test. The switch is configured to selectively couple the transceiver to the pre-qualifying test components and functional test components.