Integrated Testing System for Light Emitting Displays
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Solution Overview
Problem
Current methods for testing light emitting display devices on a mother substrate are inefficient, requiring separate testing apparatus for each device, leading to extended test times and increased costs, and do not effectively manage inferior or defective devices, which can affect test reliability and circuit damage.
Innovation Solution
A method and structure for testing multiple light emitting display devices on a mother substrate before scribing, utilizing separate transistor groups and circuit units to independently control test signals and prevent circuit damage, allowing for simultaneous testing and isolation of defective devices.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If separate testing apparatus is used for each light emitting display device, then testing can be performed on individual devices, but testing time is extended and testing cost is increased
Solution Approach 1:
The patent combines multiple testing apparatus into a single integrated testing system that can simultaneously test multiple light emitting display devices on a mother substrate. The control unit integrates signal generation, distribution, and reception functions to handle multiple devices through shared hardware resources, thereby reducing overall testing time while maintaining testing reliability through systematic signal management.
Solution Approach 2:
The testing apparatus is designed with multi-functional capabilities to handle different testing scenarios. The control unit can independently control signal supply to selected devices and perform different types of tests (normal operation testing, defective device isolation) using the same hardware platform, making the system adaptable to various testing requirements without requiring separate specialized equipment for each device type.
2Reliability
If separate testing apparatus is used for each light emitting display device, then individual device testing is possible, but testing cost is increased
Solution Approach 1:
The patent combines multiple testing apparatus into a single integrated testing system that can simultaneously test multiple light emitting display devices on a mother substrate. The control unit integrates signal generation, distribution, and reception functions to handle multiple devices through shared hardware resources, thereby reducing overall testing time while maintaining testing reliability through systematic signal management.
Solution Approach 2:
The testing apparatus is designed with multi-functional capabilities to handle different testing scenarios. The control unit can independently control signal supply to selected devices and perform different types of tests (normal operation testing, defective device isolation) using the same hardware platform, making the system adaptable to various testing requirements without requiring separate specialized equipment for each device type.
3Productivity
If sheet unit test is performed on mother substrate, then testing efficiency is improved, but inferior or defective devices can affect test reliability and cause circuit damage
Solution Approach 1:
The patent segments the control of signal supply to individual light emitting display devices through independently controllable circuit units. Each circuit unit can be independently activated or deactivated, allowing the system to isolate defective devices while maintaining testing operations on other devices. This segmentation enables reliable sheet unit testing by preventing defective devices from interfering with the testing of functional devices.
4Productivity
If sheet unit test is performed on mother substrate, then testing efficiency is improved, but circuits for controlling signals may be damaged
Solution Approach 1:
The patent implements preliminary protective measures by designing circuit units with independent on/off control capabilities. Before conducting sheet unit tests, the control unit can pre-assess device status and selectively activate only functional circuit units, preventing defective devices from causing harmful effects to other circuits. This preliminary action approach protects the testing system from potential damage while maintaining high testing efficiency.
Data Source
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AI summary
A light emitting display device may include a plurality of pixels, a plurality of scan lines for selectively applying a scan signal to the pixels, a plurality of data lines crossing the scan lines for applying a data signal to the respective pixels, a scan driver for applying a scan signal to the scan lines, and at least one first testing unit electrically connected to the scan driver, wherein at least one output line of the first testing unit is electrically connected to the scan driver, and at least one other output line of the first testing unit is electrically disconnected and in an electrically open state.