Integrated Vector Network Analyzer for RF Test Systems
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Solution Overview
Problem
Conventional vector network analyzers (VNAs) require time-consuming and inefficient procedures for error correction in RF testing, involving physical disconnection and reconnection of cables and instruments, which is cumbersome and prone to user error.
Innovation Solution
Integration of VNA functionality into RF test instruments, either through a universal VNA module connected between the instrument and the cable, or by embedding VNA circuitry directly within the instrument, allowing for automatic measurement and correction of errors without the need for physical disconnection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional VNA procedures are used for error correction, then measurement accuracy can be achieved, but the process is time-consuming and inefficient due to physical disconnection and reconnection requirements
Solution Approach 1:
The patent combines the VNA functionality with the RF test instrument into a single integrated system. The VNA circuit is embedded within the RF test instrument, allowing both error correction and RF testing to be performed through the same device without physical disconnection or reconnection of cables and instruments.
Solution Approach 2:
The integrated system performs self-calibration and self-correction. The VNA circuit automatically measures and corrects errors introduced by the interconnect while the RF test instrument is performing measurements, eliminating the need for manual calibration procedures and external intervention.
2Measurement precision
If conventional VNA procedures are used for error correction, then measurement accuracy can be achieved, but the process is cumbersome and prone to user error
Solution Approach 1:
The patent combines the VNA functionality with the RF test instrument into a single integrated system. The VNA circuit is embedded within the RF test instrument, allowing both error correction and RF testing to be performed through the same device without physical disconnection or reconnection of cables and instruments.
Solution Approach 2:
The integrated system performs self-calibration and self-correction. The VNA circuit automatically measures and corrects errors introduced by the interconnect while the RF test instrument is performing measurements, eliminating the need for manual calibration procedures and external intervention.
3Adaptability or versatility
If a VNA is combined with RF test instruments for error correction, then advanced measurement capabilities are provided, but device complexity increases
Solution Approach 1:
The patent combines the VNA functionality with the RF test instrument into a single integrated system. The VNA circuit is embedded within the RF test instrument, allowing both error correction and RF testing to be performed through the same device without physical disconnection or reconnection of cables and instruments.
Solution Approach 2:
The RF test instrument is designed to perform multiple functions: both RF signal generation/measurement and VNA-based error correction. This multi-functionality eliminates the need for separate dedicated VNA equipment while providing comprehensive measurement and correction capabilities within a single instrument.
Data Source
AI summary
A method is provided for determining source match of a test system including an RF source, a vector network analyzer (VNA) and a test port. The method includes connecting a first calibration standard to the test port; generating an RF signal using the RF source, and applying the RF signal to the first calibration standard; measuring a first incident signal of the RF signal at a first receiver of the test system, and measuring a first reflected signal at a second receiver of the test system; connecting a second calibration standard to the test port; measuring a second incident signal of the RF signal at the first receiver of the test system, and measuring a second reflected signal at the second receiver of the test system; and determining the source match of the test system using the first incident and reflected signals and the second incident and reflected signals.