Integrated X-ray Source with Multilayer Optics
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Conventional X-ray imaging systems face inefficiencies in redirecting X-ray beams due to distance-related intensity loss and alignment issues between the X-ray source and optics, limiting their application in non-destructive testing and other imaging applications.
Innovation Solution
An integrated X-ray source with a stepped target in physical contact with total internal reflection multilayer optic devices, allowing for optimal X-ray intensity and alignment, and using graded multilayer optic devices to redirect X-rays via total internal reflection, producing beams with desired spectral and spatial properties.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If the optic is placed at a large distance from the X-ray generation point, then the strain on the optic is reduced and manufacturing becomes easier, but the X-ray intensity decreases and alignment robustness deteriorates
Solution Approach 1:
The patent integrates the optic directly with the target, placing them in close proximity or direct contact. This merging eliminates the need for separate mounting and alignment mechanisms, allowing the optic to be positioned optimally close to the X-ray generation point without compromising manufacturing feasibility, thus resolving the contradiction between proximity for intensity and distance for manufacturing ease
2Illumination intensity
If the optic is placed close to the X-ray generation point, then the X-ray intensity is maximized, but alignment between the optic and target becomes more difficult and sensitive
Solution Approach 1:
By integrating the optic with the target as a unified structure, the patent eliminates relative alignment requirements between separate components. The optic and target become a single aligned unit, maximizing X-ray intensity while eliminating alignment precision issues that would arise from positioning separate components in close proximity
3Quantity of substance
If polycapillary optics are used to collect X-rays, then a reasonable source solid angle is collected, but the channel size is too large to utilize small source spots and the optics must be placed far from the generation point
Solution Approach 1:
The patent transitions from polycapillary optics to multilayer optics, fundamentally changing the optical parameter (from capillary channel structure to multilayer interference structure). This parameter change enables the optic to function effectively at much smaller dimensions and closer proximity to the X-ray source, allowing utilization of small source spots while maintaining effective X-ray collection
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration enhances X-ray flux output, provides a more compact and robust design, and enables the use of X-rays in applications previously limited by intensity and alignment issues, such as computed tomography of electronic circuit boards.
Implementation Method 1
total internal reflection multilayer optic devices, allowing for optimal X-ray intensity and alignment, and using graded multilayer optic devices to redirect X-rays via total internal reflection
Data Source
Figure 1
Figure 2
Figure 3~4
AI summary
An integrated X-ray source is provided. The integrated X-ray source includes a target for emitting X-rays upon being struck by one or more excitation beams, and one or more total internal reflection multilayer optic devices in physical contact with the target to transmit at least a portion of the X rays through total internal reflection to produce X-ray beams, wherein the optic device comprises an input face for receiving the X rays and an output face through which the X-ray beams exit the integrated X-ray source. Furthermore a multilayer optic device is provided comprising at least one layer with a low refractive index and at least one layer with a high refractive index. The layer showing a low refractive index is interspersed with target material, i.e. material which produces X-rays upon being struck by an excitation beam.