Integrated XRD CT Apparatus Monochromatic Source

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Solution Overview

Problem

Conventional X-ray diffraction (XRD) and computed tomography (CT) systems face limitations in combining accurate XRD measurements with CT functionality, particularly in detecting materials with low atomic numbers and achieving high contrast and resolution, especially for baggage inspection and pharmaceutical analysis.

Innovation Solution

An integrated apparatus and method that combines angle dispersive XRD with CT functionality using a monochromatic X-ray source emitting in the range of 4.5keV to 25keV, with a two-dimensional photon counting detector, allowing for both XRD and CT measurements by varying the sample and source positions, and employing a beam conditioner to reduce scattering and improve signal-to-noise ratio.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional absorption X-ray images are used for CT measurements, then three-dimensional imaging is achieved, but contrast and resolution are insufficient for detecting materials with low atomic numbers

Engineering Contradiction:
Improvedetection accuracyVSAvoidlow contrast for low atomic number materials
Core Design Contradiction:
Measurement precisionVSObject-affected harmful factors

Solution Approach 1:

The patent combines angle dispersive XRD and CT measurements into a single integrated system using the same monochromatic X-ray source and detector. This merging allows simultaneous acquisition of both diffraction data (for material identification) and absorption data (for three-dimensional imaging), resolving the contradiction by enabling both functions to work together rather than separately

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent uses monochromatic X-rays with energy in the range of 4.5keV to 25keV, which is a specific parameter change from conventional broad spectrum X-rays. This monochromatic radiation provides enhanced contrast for low atomic number materials while enabling accurate angle dispersive XRD measurements, directly addressing the detection accuracy and contrast issue

Inventive Principle:
Principle #35Parameter changes

2Use of energy by moving object

If broad spectrum X-rays are used for CT measurements, then penetration is improved, but beam hardening effects occur reducing image quality

Engineering Contradiction:
ImproveX-ray penetrationVSAvoidimage quality
Core Design Contradiction:
Use of energy by moving objectVSMeasurement precision

Solution Approach 1:

The patent employs monochromatic X-ray radiation with a specific energy range (4.5keV to 25keV) instead of broad spectrum X-rays. This parameter change eliminates beam hardening effects because monochromatic radiation does not undergo spectral hardening during transmission, thereby maintaining high image quality while achieving sufficient penetration through the sample

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent introduces a beam conditioner as an intermediary component between the X-ray source and the sample. This beam conditioner shapes and conditions the monochromatic X-ray beam to optimize penetration while maintaining beam quality, acting as a mediator that ensures both sufficient energy for penetration and precision for high-quality imaging

Inventive Principle:
Principle #24Intermediary (Mediator)

3Device complexity

If a single apparatus is designed to perform both XRD and CT measurements, then device complexity is reduced, but functional versatility may be compromised

Engineering Contradiction:
Improvesystem integrationVSAvoidmeasurement functionality
Core Design Contradiction:
Device complexityVSAdaptability or versatility

Solution Approach 1:

The patent designs a universal X-ray apparatus that can perform both angle dispersive XRD and CT measurements using the same monochromatic X-ray source, sample stage, and two-dimensional detector. The system achieves multi-functionality by implementing different measurement geometries and data processing methods within a single integrated platform, maintaining both XRD and CT capabilities without requiring separate dedicated systems

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The patent employs a dynamic measurement system where the sample stage can be rotated and positioned to accommodate different measurement modes. The system dynamically switches between XRD geometry (with specific angular positioning) and CT geometry (with rotational sampling), allowing a single apparatus to adapt to different measurement requirements and maintain full functional versatility

Inventive Principle:
Principle #15Dynamics

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables accurate detection of materials with low atomic numbers, improved contrast, and enhanced resolution in imaging samples, reducing beam hardening effects and allowing for a single apparatus to perform both XRD and CT measurements effectively.

Implementation Method 1

The X-ray source may be a source that emits X-rays having a small number of peaks, for example two, in an energy band in the range 4.5keV to 25keV

Methodology Applied
Scientific EffectX-ray emission: X-Ray

Implementation Method 2

In angle dispersive measurements, a monochromatic beam is used, frequently created using a monochromator, and the XRD measurements made as a function of diffraction angle to probe different length scales in the sample

Methodology Applied
Scientific EffectX-ray diffraction: Bragg Diffraction

Implementation Method 3

a CT mode to measure absorption of a sample as a function of position across the sample with the two-dimensional X-ray detector

Methodology Applied
Scientific EffectX-ray absorption: Absorption (EM radiation)

Implementation Method 4

employing a beam conditioner to reduce scattering and improve signal-to-noise ratio

Methodology Applied
Scientific EffectScattering reduction: Scattering

Data Source

PatentEP2365319B1X-ray diffraction and computed tomography
Publication Date: 2019.01.23 PANALYTICAL BV
  • EP2365319B1 patent drawingFigure 1
  • EP2365319B1 patent drawingFigure 2
  • EP2365319B1 patent drawingFigure 3

AI summary

An imaging system combines CT and XRD measurements, both measuring the XRD diffraction and the absorption as a function of energy. A goniometer 2, source 4 and two dimensional detector 10 may be used. Embodiments use relatively soft X-rays in the 5-25 keV range. An integrated mounting unit to mount the sample 8 close to detector 10 is also described.