Intensity Modulating Element for 3D Surface Mapping
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Solution Overview
Problem
Current borescopes and endoscopes face challenges in accurately performing 3D surface mapping and dimensional measurements due to limitations in existing technologies, such as stereo viewing methods, dot projection techniques, and single line profiling, which often require significant processing, skilled operators, and are not suitable for full-field object measurements, especially in small probes where size constraints are a concern.
Innovation Solution
A borescope probe equipped with an intensity modulating element featuring a plurality of light emitters and grating elements that project fringe sets for phase-shift analysis, allowing for more accurate phase-shift analysis and enabling full-field surface mapping by altering the light distribution to create structured-light patterns for precise measurement and imaging.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If stereo viewing or dot projection methods are used to obtain 3D data, then 3D surface mapping capability is provided, but the device complexity and processing requirements increase significantly
Solution Approach 1:
The patent uses periodic fringe patterns (repeating sinusoidal or square wave patterns) projected onto the surface instead of random dot patterns. These periodic patterns enable simpler correlation-based phase measurement algorithms, reducing computational complexity while maintaining full-field 3D mapping capability. The regular structure of the fringes allows for efficient phase unwrapping and surface reconstruction.
Solution Approach 2:
The patent varies the phase shift parameter of the projected fringe patterns across multiple projections (e.g., 0, 90, 180, 270 degrees). By changing only the phase parameter while keeping the pattern structure identical, the system enables accurate surface mapping through phase demodulation algorithms that are computationally less intensive than stereo matching, thus reducing processing requirements.
2Device complexity
If a single line profile is projected for measurement, then processing is simplified, but the ability to obtain full-field surface mapping is limited
Solution Approach 1:
The patent extends the measurement from a single line (1D) to a two-dimensional full-field pattern by projecting fringe patterns that cover the entire field of view. The fringe patterns consist of multiple lines arranged in a grid or array, allowing simultaneous measurement of all points across the surface rather than requiring sequential line scanning, thus achieving full-field mapping with simplified processing.
Solution Approach 2:
The patent pre-structures the light pattern into regular fringe patterns before projection, with known spatial frequencies and phases. This preliminary structuring of the light field enables direct phase calculation from captured images without requiring complex post-processing or sequential scanning, achieving both full-field coverage and processing simplicity simultaneously.
3Measurement precision
If multiple fringe sets with physical offsets are used to determine absolute phase, then measurement accuracy is improved, but the device complexity increases
Solution Approach 1:
The patent uses periodic fringe patterns with well-defined spatial frequencies and phases. By projecting a small number of phase-shifted patterns (typically 3-4) with identical periodic structures but different phase offsets, the system can determine absolute phase through standard phase-shifting algorithms, avoiding the need for complex multiple-frequency or multi-set approaches while maintaining measurement accuracy.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution provides accurate and efficient 3D surface mapping and dimensional measurements with improved brightness and contrast, reducing the need for complex equipment and skilled operators, and is suitable for small probes, enabling the capture of detailed surface information with high precision.
Implementation Method 1
at least one intensity modulating element comprising a plurality of columns of a plurality of grating elements
Data Source
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AI summary
An intensity modulating element for a probe having a plurality of light emitters for phase-shift analysis and measurement is disclosed. The intensity modulating element comprises a plurality of columns of a plurality of grating elements formed by two opposing patterns to project a plurality of fringe sets comprising a structured light pattern.