Interchangeable Probe Holder for Semiconductor Test
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Solution Overview
Problem
Existing probe units require multiple insulating blocks for different semiconductor IC connection patterns, leading to a complex and cumbersome configuration for changing the arrangement of contact probes.
Innovation Solution
A probe unit with a conductive probe holder featuring interchangeable hole portions of the same shape, allowing signal, power supply, and grounding probes to be rearranged without the need for multiple insulating blocks, simplifying the holder configuration.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If multiple insulating blocks with different hole arrangements are prepared for different semiconductor IC connection patterns, then the probe unit can accommodate various IC arrangements, but the device complexity and number of components increase
Solution Approach 1:
The probe holder is designed with a single insulating block that contains multiple hole portions with identical hole shapes, allowing any probe to be inserted into any hole. This universal design enables the same probe holder to accommodate various semiconductor IC connection patterns without requiring multiple specialized insulating blocks, thereby reducing device complexity while maintaining adaptability.
Solution Approach 2:
The probe holder is divided into multiple independent hole portions, each capable of accommodating different types of probes (signal probe, power supply probe, grounding probe). This segmentation allows flexible arrangement of probes within the same insulating block structure, enabling adaptation to different IC connection patterns without changing the overall holder design.
2Adaptability or versatility
If multiple insulating blocks with different hole arrangements are prepared for different semiconductor IC connection patterns, then the probe unit can accommodate various IC arrangements, but the ease of operation and assembly simplicity deteriorate
Solution Approach 1:
The single insulating block with identical hole portions serves multiple functions: it can accommodate different probe arrangements, support various semiconductor IC connection patterns, and maintain electrical insulation. This eliminates the need to switch between multiple insulating blocks, greatly simplifying operation and assembly while preserving adaptability.
3Adaptability or versatility
If multiple insulating blocks with different hole arrangements are prepared for different semiconductor IC connection patterns, then the probe unit can accommodate various IC arrangements, but the manufacturing complexity increases
Solution Approach 1:
By designing a single universal insulating block with identical hole portions, the manufacturing process is simplified. Only one type of insulating block needs to be produced, inspected, and stored, rather than manufacturing multiple specialized blocks with different hole arrangements. This significantly reduces manufacturing complexity while maintaining the ability to accommodate various IC connection patterns through flexible probe arrangement.
Data Source
AI summary
A probe unit includes: a signal probe configured to receive and output a signal from and to a predetermined circuit structure; a power supply probe configured to supply power to the predetermined circuit structure; a grounding probe configured to supply a ground potential to the predetermined circuit structure; and a conductive probe holder including a plurality of hole portions in which the signal probe, the power supply probe, and the grounding probe are insertable, the plurality of hole portions having a same hole shape as one another, wherein the signal probe, the power supply probe, and the grounding probe inserted into the plurality of hole portions are interchangeable with one another to change an arrangement of the signal probe, the power supply probe, and the grounding probe.