Interference-Based Non-Contact Angle Measurement in Small Spaces
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Solution Overview
Problem
Existing non-contact angle measurement methods face limitations such as requiring long base lines or target objects, contact mode, complicated optical alignment, poor accuracy, and long measurement cycles, especially when dealing with small or microscopic objects.
Innovation Solution
A non-contact angle measurement method utilizing boson or fermion particles to generate an interference pattern between two planes, allowing for accurate angle determination without direct contact or complex alignment, using a particle source and detector to measure the angle based on the interference pattern, suitable for macroscopic and microscopic scales.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional Lloyd's mirror fringe pattern technique is used for non-contact angle measurement, then optical alignment can be achieved, but the surface must be polished to a mirror surface and the measurement setup becomes complex
Solution Approach 1:
The patent extracts the angle measurement function from complex optical alignment systems and implements it through a simplified laser-based interferometric method. By using a single laser beam and analyzing the interference pattern between the reference beam and the beam reflected from the test surface, the system eliminates the need for traditional Lloyd's mirror arrangements and complex optical components while maintaining measurement precision.
Solution Approach 2:
The patent replaces mechanical contact measurement methods and complex optical alignment systems with a non-contact laser interferometric measurement system. This substitution eliminates mechanical contact requirements and simplifies the measurement setup by using light interference patterns to directly determine angular measurements without complex mechanical alignment procedures.
2Ease of operation
If laser-based angle measurement tools are used, then non-contact measurement is achieved, but manual alignment is required and the measurement process becomes complicated
Solution Approach 1:
The patent implements self-alignment capability through the interferometric measurement principle. The system automatically establishes the measurement reference by using the test surface itself as the reflection source, eliminating the need for manual alignment of external reference surfaces. The interference pattern naturally forms based on the angle between the laser beam and the test surface, allowing the system to self-calibrate and measure without operator intervention for alignment.
3Measurement precision
If long base lines or target objects are used for angle measurement, then measurement accuracy can be improved, but the measurement setup cannot fit into small spaces
Solution Approach 1:
The patent transitions from spatial baseline measurement to optical path difference measurement by utilizing the interference dimension. Instead of requiring long physical baselines in real space, the system uses the wave nature of light to create interference patterns that encode angular information. This dimensional transition from macroscopic spatial measurement to microscopic optical wavelength measurement enables high-precision angle measurement in compact spaces.
4Productivity
If contact mode measurement is used to determine angle, then measurement can be performed, but the measurement process requires direct contact with the object
Solution Approach 1:
The patent replaces mechanical contact measurement with optical non-contact measurement using laser interferometry. The system directs a laser beam at the test surface and analyzes the interference pattern created by the reflected beam to determine angular measurements. This optical substitution eliminates all mechanical contact between the measurement instrument and the object, preventing any potential damage or contamination while maintaining measurement capability.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables ultra-fine accuracy, reduces measurement time, eliminates the need for complex alignment, and fits within small spaces, providing accurate angle measurements for various object configurations, including 3D models.
Implementation Method 1
an interference pattern generated by the boson or fermion particles corresponding to a slit, a bump, or a hole of a first plane and matter waves associated with the boson or fermion particles reflected by a second plane
Data Source
Figure 110
Figure 111A~111B
AI summary
A non-contact angle measuring apparatus includes a matter-wave and energy (MWE) particle source and a detector. The MWE particle source is used for generating boson or fermion particles. The detector is used for detecting a plurality peaks or valleys of an interference pattern generated by 1) the boson or fermion particles corresponding to a slit, a bump, or a hole of a first plane and 2) matter waves'wavefront-split associated with the boson or fermion particles reflected by a second plane, wherein angular locations of the plurality peaks or valleys of the interference pattern, a first distance between a joint region of the first plane and the second plane, and a second distance between the detector and the slit are used for deciding an angle between the first plane and the second plane.