Interference Filter Protruding Area Holding for Spectroscopic Analyzer
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Solution Overview
Problem
The existing interference filters in spectroscopic analyzers face issues with resolution degradation due to thermal expansion and deformation caused by heat transmission from light source devices, leading to fluctuations in light transmission wavelength and reduced accuracy.
Innovation Solution
An optical module design featuring an interference filter with a light interference area and a protruding area, where the holding member secures the filter at the protruding area's distal end, preventing deformation and heat transmission to the light interference area, thus maintaining the parallel state of reflecting films and enhancing resolution.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the holding housing holds the outer circumference of the etalon adjacent to the reflecting film, then the etalon is securely held, but the substrate deforms due to thermal expansion and holding force causing resolution decrease
Solution Approach 1:
The etalon substrate is divided into two functional regions: a light interference area where reflecting films are formed for optical function, and a protruding area that extends beyond the light interference area for mechanical holding. This segmentation allows the holding housing to grip the protruding area without contacting the light interference area, preventing substrate deformation while maintaining secure holding.
Solution Approach 2:
The holding function is extracted from the light interference area by providing a dedicated protruding area that extends beyond the light interference region. The holding housing specifically grips this protruding area, separating the holding function from the optical function area, thereby preventing thermal and mechanical interference with the reflecting films.
2Reliability
If the holding housing holds the etalon adjacent to the reflecting film, then the etalon is fixed in position, but heat from the light source device transmits to the etalon causing transmission wavelength fluctuation
Solution Approach 1:
The substrate is segmented into a light interference area for optical function and a protruding area for thermal isolation. The holding housing grips only the protruding area, creating a thermal barrier that prevents heat from the light source device from transmitting to the light interference area where the reflecting films are located, thus maintaining transmission wavelength stability.
Solution Approach 2:
The protruding area acts as an intermediary or thermal buffer between the holding housing and the light interference area. By gripping the protruding area, the holding housing isolates the light interference area from thermal effects, allowing position stability while preventing heat transmission.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration effectively suppresses deformation and heat transmission, maintaining high resolution and accuracy in light intensity measurement and spectroscopic analysis.
Implementation Method 1
the interference filter causes the incident light to experience multiple interference between the pair of reflecting films and passes only light of the specific wavelength which is strengthened by the multiple interference
Implementation Method 2
the gap can be adjusted by an electrostatic attractive force by applying a driving voltage to the respective driving electrodes
Data Source
AI summary
A colorimetric sensor includes an etalon including a first substrate, a second substrate facing the first substrate, a fixed mirror formed on a surface of the first substrate facing the second substrate, and a movable mirror formed on the second substrate so as to face the fixed mirror with a prescribed gap therebetween, a light receiving element that receives a test subject light having passed through the etalon, and a holding member holding the etalon. The etalon includes a light interference area facing the first and second substrates in a plan view as seen in a thickness direction of the substrate, and a protruding area protruding from the light interference area. The holding member holds the etalon at one end side of the protruding area opposite to the light interference area.