Short Coherence Interferometer Axial Range Noise Reduction

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Solution Overview

Problem

Current short coherence interferometer systems face challenges in detecting multiple axially spaced regions of a specimen, such as the eye, with limited axial measuring range and high noise levels, which restricts the detection of weakly scattering points and introduces artifacts due to interactions between strong reference signals.

Innovation Solution

A short coherence interferometer apparatus with a single reference arm and multiple measuring arms, employing balanced detection and intensity splitting of measuring beams to minimize noise and maximize signal-to-noise ratio, allowing for simultaneous detection of axially spaced regions with improved sensitivity and reduced artifacts.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Length of stationary object

If multiple separate reference arms are used to detect multiple axially spaced regions, then the measuring range is extended, but the device complexity and noise from multiple strong reference signals increase

Engineering Contradiction:
Improveaxial measuring rangeVSAvoidnumber of reference arms
Core Design Contradiction:
Length of stationary objectVSDevice complexity

Solution Approach 1:

The patent merges multiple reference arms into a single reference arm while using multiple measuring arms with different optical path lengths. This consolidation reduces device complexity and eliminates the problem of multiple strong reference signals interacting, while still enabling detection of multiple axially spaced regions through the measuring arm differentiation

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent segments the measuring arm into multiple paths with different optical lengths while keeping the reference arm unified. This segmentation allows each measuring arm to target different axial regions of the specimen independently, extending the effective measuring range without requiring multiple reference arms

Inventive Principle:
Principle #1Segmentation

2Length of stationary object

If multiple separate reference arms are used to detect multiple axially spaced regions, then the measuring range is extended, but noise levels and artifacts from reference signal interactions increase

Engineering Contradiction:
Improveaxial measuring rangeVSAvoidnoise and artifacts
Core Design Contradiction:
Length of stationary objectVSObject-affected harmful factors

Solution Approach 1:

By merging multiple reference arms into one, the patent eliminates the source of noise and artifacts caused by interactions between multiple strong reference signals. The single reference arm produces only one reference signal, which cannot interact with itself to create artifacts, while the multiple measuring arms still enable detection across extended axial ranges

Inventive Principle:
Principle #5Merging (Combining)

3Object-affected harmful factors

If a single reference arm is used with multiple measuring arms, then noise from reference signal interactions is reduced, but the ability to detect weakly scattering points is limited by noise from the reference light component

Engineering Contradiction:
Improvenoise from reference signal interactionsVSAvoiddetection sensitivity for weakly scattering points
Core Design Contradiction:
Object-affected harmful factorsVSMeasurement precision

Solution Approach 1:

The patent employs dynamic optical path length adjustment in the measuring arms, allowing the system to optimize the optical path difference between the reference arm and each measuring arm. This dynamic adjustment enables balanced detection conditions that maximize sensitivity for detecting weakly scattering points while maintaining the noise reduction benefits of a single reference arm

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent changes the optical path length parameters of the measuring arms to create appropriate optical path differences with the reference arm. By optimizing these parameters, the system achieves balanced detection that enhances sensitivity for weak signals while minimizing noise contributions from the reference light component

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution enables the detection of axially spaced regions beyond the conventional measuring range, achieving high sensitivity and precision by limiting noise contributions from the reference light component and optimizing signal quality through balanced detection and adaptive phasing of measuring beams.

Implementation Method 1

reference radiation which is superimposed with the individual measuring beams and is brought into interference with the individual measuring beams

Methodology Applied
Scientific EffectInterference: Interference

Data Source

PatentUS8717576B2Short coherence interferometer
Publication Date: 2014.05.06 CARL ZEISS MEDITEC AG
  • US8717576B2 patent drawing
  • US8717576B2 patent drawing
  • US8717576B2 patent drawing

AI summary

A short coherence interferometer apparatus for measuring multiple axially spaced regions of a specimen, in particular the eye, which has at least one measuring beam path, through which multiple individual measuring beams are incident on the specimen, and one reference beam path, through which a reference beam runs, with which the individual measuring beams are superimposed and brought into interference. The individual measuring beams are axially offset to one another upon incidence on the specimen by an amount which is adapted to the axial spacing. The interferometer apparatus superimposes each individual measuring beam with the reference beam in an interfering manner and conducts it to a detector associated with the particular individual measuring beam. The individual measuring beams are combined into a mixture in which they have varying phasing in the superposition with the reference beam.