Interferometer Line Focus for Rotation Measurement

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Solution Overview

Problem

Existing interferometric measurement systems face limitations in measuring large eccentric movements and flexibility due to punctiform focusing, which restricts the maximum measurable eccentricity and requires complex calibration routines, especially in applications like crystallographic investigations where submicrometer accuracy is needed.

Innovation Solution

The use of a linearly focused measuring beam instead of a punctiform beam, achieved through cylindrical lenses, allows for increased angle tolerance and larger measurable eccentricities, along with a compact, fiber-optically separated interferometer head suitable for vacuum and cryogenic environments, enhancing alignment efficiency and flexibility.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a punctiform focused measuring beam is used in interferometric measurement, then measurement precision can be maintained, but the maximum measurable eccentricity is restricted and alignment complexity increases

Engineering Contradiction:
Improvemeasurement precisionVSAvoidmeasurable eccentricity range
Core Design Contradiction:
Measurement precisionVSAdaptability or versatility

Solution Approach 1:

The patent transforms the measuring beam from a punctiform (point) focus to a line focus by using cylindrical lenses. This dimensional change from 0D point to 1D line allows the beam to accommodate larger angular deviations and eccentric movements while maintaining interferometric measurement capability, thereby resolving the contradiction between precision and measurable eccentricity range

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Measurement precision

If a punctiform focused measuring beam is used, then optical path precision is maintained, but alignment effort and device complexity increase

Engineering Contradiction:
Improveoptical path precisionVSAvoidalignment complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

By changing the focal geometry from point to line using cylindrical lenses, the system becomes more tolerant to misalignments in the direction perpendicular to the line focus. This reduces the precision required for alignment procedures while maintaining measurement precision along the measurement axis, thereby reducing device complexity and alignment effort

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Ease of operation

If the interferometer head is integrated and compact, then ease of operation in vacuum/cryogenic environments is improved, but thermal interference may increase

Engineering Contradiction:
Improveease of operation in vacuum/cryogenic environmentsVSAvoidthermal interference
Core Design Contradiction:
Ease of operationVSObject-affected harmful factors

Solution Approach 1:

The patent segments the interferometer into separate components: the compact interferometer head containing only passive optical elements (beam splitter, cylindrical lenses, mirrors) can be placed in vacuum/cryogenic environments, while the active components (laser source, photodetectors, control electronics) are located externally. This segmentation eliminates thermal interference from active components while maintaining ease of operation in challenging environments

Inventive Principle:
Principle #1Segmentation

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach significantly reduces alignment efforts, increases flexibility, and improves measurement accuracy by allowing larger wobble movements and eccentricities to be measured, while maintaining high resolution and minimizing thermal interference in challenging environments.

Implementation Method 1

a beam splitter (14) which divides the laser beam (11) into a reference beam (13) and a measuring beam (15)

Methodology Applied
Scientific EffectInterference: Interference

Implementation Method 2

the measuring beam (15) is focused by a cylindrical lens (17) to form a first focal line (15') which runs transversely to the axis of rotation (5)

Methodology Applied
Scientific EffectFocusing: Focusing

Implementation Method 3

recombines the light beams, lets the light beams interfere with each other to generate interference light, the interference light opto-electrically into an optical frequency and measures

Methodology Applied
Scientific EffectInterference: Interference

Implementation Method 4

a reflection plane (18) which is perpendicular to the axis of rotation (5) and which reflects the measuring beam (15) impinging thereon

Methodology Applied
Scientific EffectReflection: Reflection

Data Source

PatentEP3418677B1Device and method for interferometric measuring
Publication Date: 2021.04.14 SMARACT HLDG
  • EP3418677B1 patent drawingFigure 1~2B
  • EP3418677B1 patent drawingFigure 3~4
  • EP3418677B1 patent drawingFigure 5

AI summary

The present invention relates to a device and a method for interferometric measurement and in particular a device for measuring a rotation of a body about an axis of rotation, a positioning system with such a device and a method for measuring a rotation of a body about an axis of rotation, with an interferometer and optics.To avoid or at least reduce the recognized disadvantages of known solutions, particularly with regard to alignment effort and limited flexibility, the invention provides a device for measuring the rotation of a body (18) about an axis of rotation (5) with an interferometer (11, 12, 14, 16, 19) and an optic (17, 17a), wherein the optic (17, 17a) is configured to focus at least one measuring beam (15) of the interferometer to a first focus line which runs transversely to the axis of rotation (5), and to supply at least a part of a reflection of the first focus line from the body (18) to the interferometer, wherein the device is configured to carry out the measurement using the interferometer and the reflection.