Interferometric Shape Measurement With Adjustable Beam Deflection

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Solution Overview

Problem

Existing interferometric measurement apparatuses face challenges in measuring test objects with different surface shapes due to the need for different computer-generated holograms (CGHs) and the use of specially manufactured prisms to adjust the angle of incidence, leading to high space requirements and operational inflexibility.

Innovation Solution

A measurement apparatus with a deflection element that can be positioned using a combination of tilting and translational movements, allowing for adjustable angles of incidence without requiring reconfiguration or specially adapted beam orientation elements.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If differently configured prisms are used to generate different angles of incidence for different CGHs, then the measurement apparatus can measure test objects with different surface shapes, but the device complexity and manufacturing costs increase due to conversion work and specially manufactured components

Engineering Contradiction:
Improveability to measure different surface shapesVSAvoidconversion work and specially manufactured prisms
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

A single deflection element is designed to perform multiple functions: it can generate different angles of incidence for different CGHs and can be used across different measurement configurations. This eliminates the need for multiple specially manufactured prisms and reduces conversion work when measuring different test objects.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The deflection element is made adjustable and reconfigurable rather than fixed. It can be tilted and positioned at different locations to change the angle of incidence dynamically, allowing the same physical component to adapt to different measurement requirements without physical replacement or major reconfiguration.

Inventive Principle:
Principle #15Dynamics

2Volume of moving object

If the position of the test object remains substantially the same for different CGHs, then the measurement apparatus becomes more compact, but differently configured prisms are required to generate different angles of incidence

Engineering Contradiction:
Improvespace requirement within interferometerVSAvoidspecially manufactured prisms
Core Design Contradiction:
Volume of moving objectVSDevice complexity

Solution Approach 1:

The deflection element serves as a universal component that can generate different angles of incidence for different CGHs while maintaining a compact interferometer design. This single multi-functional element replaces what would otherwise require multiple specially manufactured prisms and larger spatial arrangements.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

Instead of changing the position of the test object (spatial arrangement in 3D space), the solution changes the angle of incidence by tilting the deflection element (changing orientation in a different dimensional parameter). This allows compact spatial arrangement while achieving different measurement configurations through angular adjustment rather than positional reconfiguration.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Ease of operation

If a single deflection element is used for different CGHs, then the measurement apparatus becomes more flexible and compact, but the angle of incidence must be adjusted

Engineering Contradiction:
Improveoperational flexibilityVSAvoidadjustment mechanism for angle of incidence
Core Design Contradiction:
Ease of operationVSDevice complexity

Solution Approach 1:

The deflection element incorporates adjustable tilting and positioning capabilities that allow dynamic reconfiguration for different measurement tasks. This dynamic adjustment mechanism provides operational flexibility while maintaining a compact design, as the same physical element can be repositioned and reoriented rather than replaced.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The solution changes the operational parameters (angle of incidence, position) of the single deflection element rather than changing the physical element itself. By adjusting these parameters, the same component can be adapted to different measurement requirements, providing flexibility without requiring complex replacement or reconfiguration of physical components.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables flexible and compact measurement of test objects with different surface shapes by maintaining the position of the test object, reducing conversion work, and eliminating the need for specially manufactured prisms.

Implementation Method 1

a diffractive optical element produces a test wave and a reference wave from an input wave

Methodology Applied
Scientific EffectDiffraction: Diffraction

Implementation Method 2

a deflection element upstream of the diffractive optical element in the beam path of the measurement radiation

Methodology Applied
Scientific EffectReflection: Reflection

Implementation Method 3

the wavefront is substantially normally incident at every location on the target shape and is reflected back onto itself by the target shape

Methodology Applied
Scientific EffectReflection: Reflection

Implementation Method 4

Deviations from the target shape can then be determined with the aid of an interferogram formed by superposing the reflected test wave on the reference wave

Methodology Applied
Scientific EffectInterference: Interference

Data Source

PatentUS12571985B2Measuring device for interferometric shape measurement
Publication Date: 2026.03.10 CARL ZEISS SMT GMBH
  • US12571985B2 patent drawing
  • US12571985B2 patent drawing
  • US12571985B2 patent drawing

AI summary

A measuring device (10) for the interferometric shape measurement of a surface (12) of a test object (14-1; 14-2) includes (i) a diffractive optical element (26-1; 26-2) that generates a test wave (28) from incoming measurement radiation (18), wherein the diffractive optical element radiates the test wave onto the surface of the test object, (ii) a deflection element (22) that is disposed upstream of the diffractive optical element in the beam path of the measurement radiation, and (iii) a holding device (24, 124) that holds the deflection element and that changes a position of the deflection element (22) through a combination of a tilting movement and a translation movement.