Interferometric Optical Component for Phase Imaging
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Solution Overview
Problem
Infrared imaging techniques struggle when samples contain both highly absorbing and weakly absorbing compounds over the same wavelength range, as absorption by highly absorbing compounds masks the absorption by weakly absorbing compounds, limiting the accuracy of images based on absorption measurements.
Innovation Solution
An optical component for an interferometric imaging device is developed, featuring an object arm and a reference arm with planar waveguides and diffraction gratings, allowing for phase measurements by interfering light that has interacted with the sample with light that has not, enabling the formation of phase shift distributions without requiring the sample to have reduced thickness.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If absorption measurements are used for imaging, then the imaging process is simple, but highly absorbing compounds mask the absorption by weakly absorbing compounds, reducing measurement precision
Solution Approach 1:
The patent changes the measurement parameter from absorption to phase shift. By using interferometric imaging that measures phase shifts rather than absorption, the system can detect weakly absorbing compounds even in the presence of highly absorbing compounds like water, thereby improving measurement precision without significantly increasing device complexity
Solution Approach 2:
The patent introduces an interferometer as an intermediary device that converts the difficult-to-measure absorption differences into easily measurable phase shift differences. The interferometer acts as a mediator that transforms the measurement problem into a more suitable domain where weak signals can be detected against strong background absorption
2Measurement precision
If a Mach-Zehnder interferometer is used for phase measurements, then phase imaging can be achieved, but the device is less robust due to relative movement between different elements
Solution Approach 1:
The patent merges the interferometer with the imaging device into a single integrated unit. By combining these previously separate components, the system eliminates relative movement between elements and improves mechanical robustness while maintaining phase measurement capability
Solution Approach 2:
The patent creates a multi-functional device that simultaneously performs interferometric phase measurements and wide-field imaging. This universal device eliminates the need for separate interferometer and imaging system, reducing the number of moving parts and improving overall system reliability
3Measurement precision
If transmission measurements are used in an interferometer, then phase measurements can be performed, but the sample thickness is strongly limited
Solution Approach 1:
The patent inverts the measurement approach by using reflection geometry instead of transmission geometry. By measuring phase shifts in reflected light rather than transmitted light, the system can analyze samples of any thickness including opaque samples, thereby removing the thickness limitation while maintaining phase measurement precision
4Ease of manufacture
If the interferometer elements are kept separate, then the device is easier to manufacture, but relative movement between elements reduces reliability
Solution Approach 1:
The patent merges previously separate interferometer elements into a single integrated component. This integration maintains ease of manufacture through monolithic fabrication while eliminating relative movement between elements, thereby improving reliability without sacrificing manufacturability
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution enables the creation of phase images of samples containing both highly and weakly absorbing compounds, allowing for the determination of chemical or biological compositions by utilizing specific frequency signatures, even in the presence of highly absorbing compounds, and allows for wide-field interferometric imaging without moving the device relative to the sample.
Implementation Method 1
a first diffraction grating formed in the first planar waveguide and capable of extracting light from said first planar waveguide and from the object arm
Implementation Method 2
at least part of the light extracted from the object arm interferes with at least part of the light extracted from the reference arm
Implementation Method 3
a first planar waveguide extending parallel to a plane called the plane of the optical component
Data Source
AI summary
An optical component for an interferometric imaging device, which comprises:an object arm, including a first planar waveguide and a first diffraction grating formed in the first planar waveguide and capable of extracting light from the object arm;a reference arm, comprising a second planar waveguide and a second diffraction grating formed in the second planar waveguide and capable of extracting light from the reference arm;wherein the optical component is configured such that, in use with an optically reflective surface extending parallel to the plane of the optical component between the object arm and the reference arm, at least part of the light extracted from the object arm interferes with at least part of the light extracted from the reference arm.