Combined Interferometric Scattering and Fluorescence Microscope for Quantum Yield
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Solution Overview
Problem
Current methods for measuring quantum yield, particularly for smaller fractions of samples like single particles or specific regions, are impractical due to the need for extensive sample preparation and the inability to differentiate or characterize quantum efficiency at the individual particle or regional level.
Innovation Solution
A combined interferometric scattering and fluorescence microscope is used to determine quantum yield by calibrating illumination and detection channels for scattering and fluorescence measurements, allowing for direct calculation of quantum yield from interferometric scattering and fluorescence signals.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional fluorescence measurement methods are used to measure quantum yield of single particles, then quantum yield information can be obtained, but extensive sample preparation is required which alters sample properties
Solution Approach 1:
The patent combines interferometric scattering microscopy and fluorescence microscopy into a single integrated system. The interferometric scattering channel provides label-free detection and sizing of single particles, while the fluorescence channel simultaneously measures quantum yield. This merging eliminates the need for separate measurements and complex sample preparation required by conventional methods, allowing direct measurement of quantum yield from single particles in their native state.
2Measurement precision
If conventional fluorescence measurement methods are used, then quantum yield can be measured, but the methods cannot differentiate quantum efficiency at individual particle level
Solution Approach 1:
The patent segments the measurement process into two parallel channels: interferometric scattering detection for single particle identification and sizing, and fluorescence detection for quantum yield measurement. By correlating the scattering signal (which provides single particle information) with the fluorescence signal, the system achieves single particle resolution quantum yield measurements, differentiating quantum efficiency at the individual particle level rather than providing only bulk averages.
3Measurement precision
If scanning electron microscopy with photoluminescence microscopy is used, then single particle PLQY can be determined, but complex sample preparation alters sample properties and in operando measurements are not possible
Solution Approach 1:
The interferometric scattering channel serves as a self-service mechanism that automatically identifies and sizes single particles without requiring external labeling or complex preparation. The scattering signal itself provides the necessary information for particle detection and characterization, eliminating the need for fluorescent labels or complex sample preparation steps required by conventional electron microscopy methods. This allows in operando measurements on samples in their native state.
4Productivity
If bulk solution measurements are used, then quantum yield can be measured, but information about size, shape, and heterogeneities at single particle level is lost
Solution Approach 1:
The patent adds the dimension of spatial resolution by using interferometric scattering microscopy to resolve individual particles within the bulk solution. Instead of measuring only bulk averages, the system correlates scattering signals (which provide single particle position and size information) with fluorescence signals, thereby accessing single particle properties while maintaining the ability to measure multiple particles efficiently. This dimensional addition transforms bulk measurement into single particle-resolved measurement.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This method enables fast and convenient measurement of quantum yield for small sample fractions without altering the sample's properties, eliminating the need for complex sample preparation and allowing for in-operando measurements.
Implementation Method 1
performing an interferometric scattering measurement on a sample, thereby obtaining interferometric scattering signals from the sample
Implementation Method 2
illuminating or applying an electrical bias to the sample, thereby obtaining fluorescence signals from the sample
Data Source
Figure 1A~1B
Figure 2
Figure 3~4
AI summary
The invention refers to a method of determining a quantum yield from a sample (22) by using a combined interferometric scattering and fluorescence microscope (10), comprising the steps of a) calibrating each of the illumination and detection channels for scattering measurements (16, 18), the excitation unit (32) and the detection channel (34) for fluorescence measurements; b) performing an interferometric scattering measurement on the sample (22), thereby obtaining interferometric scattering signals from the sample (22); c) illuminating or applying an electrical bias to the sample, thereby obtaining fluorescence signals from the sample (22); and d) calculating a quantum yield of the sample (22) based on the interferometric scattering and fluorescence signals. Further, a microscope (10) which is adapted to carry out the above method is proposed.