Interferometric Surface Profile Inspection for Soft Coatings

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Solution Overview

Problem

Current methods for characterizing the surface profile of soft coatings, particularly at the three-phase contact line, are limited by the fast and microscopic nature of wetting ridge formation, and the transparency of the coatings, making it difficult to visualize using conventional microscopy techniques, especially when high surface tension droplets cause deformation and changes in refractive index and stiffness.

Innovation Solution

A surface profile inspection method and system that captures interferograms of a surface profile depicting interference between a specimen beam and a modulated reference beam, extracts pixel values, calculates phase information, and reconstructs the surface profile, enabling improved spatial and temporal characterization of soft coatings.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional microscopy techniques are used to observe soft coatings, then the observation process is simple, but the transparency of the coatings makes it difficult to visualize the surface profile and wetting ridge formation

Engineering Contradiction:
Improvesurface profile characterizationVSAvoidvisualization difficulty
Core Design Contradiction:
Measurement precisionVSDifficulty of detecting and measuring

Solution Approach 1:

The patent introduces an intermediary optical system (interferometer with reference beam and specimen beam) that mediates the observation of transparent soft coatings. The interferometer converts invisible phase changes in the transparent coating into visible interference fringes, enabling precise measurement of surface profile and wetting ridge formation that cannot be directly observed with conventional microscopy

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent changes the measurement parameter from direct optical absorption/reflection (which fails for transparent materials) to optical path difference and phase information. By measuring the phase changes in the specimen beam relative to the reference beam, the system can detect subtle surface profile changes and wetting ridge formation in transparent soft coatings with high precision

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If high surface tension droplets are applied to soft coatings with low Young modulus, then wetting dynamics can be studied, but large deformation and high slope wetting ridge formation occurs making visualization difficult

Engineering Contradiction:
Improvewetting dynamics characterizationVSAvoidwetting ridge slope
Core Design Contradiction:
Measurement precisionVSShape

Solution Approach 1:

The patent replaces direct mechanical/optical imaging of steep wetting ridges with interferometric measurement. Instead of trying to directly image the high-slope wetting ridge structure mechanically or optically, the system uses optical interference to measure the phase differences caused by the ridge, converting a difficult direct imaging problem into a measurable phase difference problem

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent measures the wetting ridge not in direct spatial dimensions but in the phase dimension. By converting the three-dimensional surface profile information into phase information through interferometry, the system can accurately characterize wetting ridge formation even when the ridge has high slopes that would be difficult to resolve with direct imaging methods

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Ease of manufacture

If trial-and-error approaches are used for soft coating development, then the development process is simple to implement, but accurate characterization tools are lacking leading to inefficient development

Engineering Contradiction:
Improvecoating development processVSAvoidcoating development efficiency
Core Design Contradiction:
Ease of manufactureVSProductivity

Solution Approach 1:

The patent implements a feedback mechanism by providing real-time, accurate surface profile characterization during soft coating development. The interferometric system continuously monitors wetting dynamics and surface profile changes, giving developers immediate feedback on coating performance, enabling rapid iteration and optimization rather than relying on slow trial-and-error approaches

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The patent replaces subjective, qualitative trial-and-error evaluation with objective, quantitative interferometric measurement. By substituting mechanical/visual inspection with optical interference-based measurement, the system provides precise numerical data on surface profile and wetting dynamics, enabling systematic optimization of soft coating formulations and processes

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach provides accurate and detailed characterization of soft coatings' surface profiles, overcoming visualization challenges and enabling more effective development of anti-contaminant and self-cleaning coatings by capturing high-resolution, dynamic wetting processes.

Implementation Method 1

capturing a plurality of interferograms of a surface profile depicting interference between a specimen beam reflected from a surface having the surface profile and a modulated reference beam

Methodology Applied
Scientific EffectInterference: Interference

Data Source

PatentUS12018931B2Surface profile inspection methods and systems
Publication Date: 2024.06.25 NANYANG TECH UNIV
  • US12018931B2 patent drawing
  • US12018931B2 patent drawing
  • US12018931B2 patent drawing

AI summary

A surface profile inspection method and a surface profile inspection system are provided. The surface profile inspection method includes capturing a plurality of interferograms of a surface profile depicting interference between a specimen beam reflected from a surface having the surface profile and a modulated reference beam, wherein each of the plurality of interferograms corresponds to a phase of modulation of the modulated reference beam; extracting pixel values of the plurality of interferograms; calculating phase information of each of the plurality of interferograms based on the extracted pixel values, the phase information of each of the plurality of interferograms related to the phase of modulation of the modulated reference beam at a time the interferogram was captured; and reconstructing the surface profile based on the calculated phase information.