Low-Coherence Interferometry for Multi-Angle Scattering Measurement
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Solution Overview
Problem
Existing optical measurement devices require multiple light sources and detectors, leading to a large-scale device configuration, difficulty in adjusting optical axes, and inability to measure scattering intensity at different angles or wavelengths, especially in suspensions causing multiple scattering.
Innovation Solution
An optical measurement device utilizing a low-coherence interferometer with detection units for interference light intensity per wavelength and scattering angle, and a conversion unit to extract scattering intensity data, allowing for easy measurement at different angles and wavelengths.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If multiple light sources and detectors are used to measure scattering intensity at different wavelengths and angles, then measurement capability is improved, but device complexity increases
Solution Approach 1:
A single light source is designed to emit multiple wavelengths simultaneously, and a single detector is configured to detect scattered light at multiple angles. This multi-functional design allows the device to measure scattering intensity across different wavelengths and angles without requiring separate light sources and detectors for each measurement condition, thereby reducing device complexity while maintaining comprehensive measurement capability
Solution Approach 2:
The patent combines multiple measurement functions into a unified detection system where one detector captures scattered light information across multiple angles and wavelengths. By merging the detection capabilities that would traditionally require separate devices, the system achieves comprehensive scattering measurement with simplified configuration
2Measurement precision
If multiple detectors and light sources are arranged to detect scattered light from the same sample region, then measurement precision is improved, but difficulty in adjusting optical axes increases
Solution Approach 1:
The single detector is designed with multi-angular detection capability, allowing it to capture scattered light from multiple angles simultaneously while maintaining a fixed position. This eliminates the need to precisely align multiple detectors with the sample region, reducing optical axis adjustment difficulty while preserving measurement precision through its inherent multi-directional sensing capability
3Adaptability or versatility
If a light combination unit is added to introduce both light sources coaxially, then measurement versatility is improved, but device complexity increases
Solution Approach 1:
The light source is designed to emit multiple wavelengths inherently without requiring a light combination unit. This multi-wavelength emission capability is built into the light source itself, allowing simultaneous illumination at different wavelengths to reach the sample coaxially through a single optical path, thereby achieving measurement versatility without adding the complexity of a light combination unit
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables efficient measurement of scattering intensity at various angles and wavelengths, facilitating accurate particle diameter calculation and size distribution analysis.
Implementation Method 1
detects an interference light intensity per wavelength by means of interference between at least a part of scattered light obtained by allowing incident light to be incident on a dispersion liquid including particles and reference light
Data Source
AI summary
Provided is an optical measurement device capable of easily measuring a scattering intensity at different scattering angles or different wavelengths. An optical measurement device with a low-coherence interferometer includes a detection unit having at least one of a first detection unit that detects an interference light intensity per wavelength by means of interference between at least a part of scattered light obtained by allowing incident light to be incident on a dispersion liquid including particles and reference light or a second detection unit that detects an interference light intensity per scattering angle by means of interference between at least a part of the scattered light obtained by allowing the incident light to be incident on the dispersion liquid including the particles and the reference light, and a conversion unit extracts a scattering intensity at a specific depth and a specific wavelength of the dispersion liquid from data of the interference light intensity per wavelength detected by the first detection unit or a scattering intensity at a specific depth and a specific scattering angle of the dispersion liquid from data of the interference light intensity per scattering angle detected by the second detection unit and converts data of the extracted scattering intensity into time fluctuation data of the scattered light at the specific depth of the dispersion liquid.