Interleaved Transistor Elements for RF Switch Thermal Management

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Solution Overview

Problem

Microwave field effect transistors in RF circuits generate significant heat during operation, leading to increased junction temperatures that can exceed the device's temperature rating, limiting RF power handling and reliability.

Innovation Solution

Interleaving high-power and low-power dissipating transistor elements in an alternating manner within a monolithic integrated circuit to distribute power dissipation more evenly, reducing peak junction temperatures without increasing die area or affecting device performance.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Power

If power handling capability is increased, then RF power capability is improved, but junction temperature increases

Engineering Contradiction:
ImproveRF power capabilityVSAvoidjunction temperature
Core Design Contradiction:
PowerVSTemperature

Solution Approach 1:

The transistor elements are segmented into different power dissipation categories (high-power and low-power dissipating elements) and spatially separated through interleaved arrangement. This segmentation allows heat generation to be distributed across different regions of the device, preventing concentration of thermal energy in a single location and thereby reducing peak junction temperatures while maintaining high overall power handling capability.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different regions of the device are assigned different functional qualities based on power dissipation characteristics. High-power dissipating elements are strategically positioned and interleaved with low-power dissipating elements, creating local variations in thermal properties. This local quality differentiation enables effective heat management in specific regions while maintaining high power capability in others, resolving the contradiction between power handling and temperature control.

Inventive Principle:
Principle #3Local quality

2Temperature

If transistor elements are interleaved to distribute power dissipation, then peak junction temperature is reduced, but device structure becomes more complex

Engineering Contradiction:
Improvepeak junction temperatureVSAvoidtransistor element arrangement
Core Design Contradiction:
TemperatureVSDevice complexity

Solution Approach 1:

The patent merges multiple transistor elements with different power dissipation characteristics into a single integrated device structure. By combining high-power and low-power dissipating elements within the same device and arranging them in an interleaved pattern, the complexity of thermal management is reduced to a systematic spatial arrangement rather than requiring separate cooling systems or complex thermal pathways for each element type.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The interleaved arrangement introduces a spatial dimension to thermal management by distributing elements along the device structure rather than concentrating them. This dimensional approach to arranging transistor elements transforms the thermal management problem from a one-dimensional heat sink challenge to a multi-dimensional spatial distribution solution, simplifying the overall thermal control strategy while effectively reducing peak temperatures.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Data Source

PatentUS10366986B1Integrated circuits and devices with interleaved transistor elements, and methods of their fabrication
Publication Date: 2019.07.30 NXP USA INC
  • US10366986B1 patent drawing
  • US10366986B1 patent drawing
  • US10366986B1 patent drawing

AI summary

A monolithic integrated circuit includes first and second pluralities of parallel-connected transistor elements (e.g., transistor fingers). To spread heat in the IC, the first and second pluralities of transistor elements are interleaved with each other and arranged in a first row. The IC also may include third and fourth pluralities of parallel-connected transistor elements arranged in a second row. The transistor elements in the first row may be series and shunt transistors of an RF switch transmit path, and the transistor elements in the second row may be series and shunt transistors of an RF switch receive path. During a transmit mode of operation, the series transistors in the transmit path and the shunt transistors in the receive path are closed. During a receive mode of operation, the shunt transistors in the transmit path and the series transistors in the receive path are closed.