Internal Address Generation Circuit Aging Detection
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Solution Overview
Problem
Semiconductor devices face challenges in managing internal address generation for memory cells, particularly in efficiently handling frequent access operations that lead to stress on memory cells due to constant address combinations, which existing technologies fail to address effectively.
Innovation Solution
The implementation of an internal address generation circuit that includes aging detectors and decoders, which generate aging signals based on the number of access operations, allowing for dynamic adjustment of internal address signals to relieve stress on frequently accessed memory cells by changing actual addresses without altering the address signal combinations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional address generation circuits are used, then the device structure remains simple, but memory cells experience stress due to constant address combinations during frequent access operations
Solution Approach 1:
The patent implements dynamic address signal generation by introducing aging detectors that monitor access frequency and generate control signals to switch between different address generation modes. The address generation circuit transitions from static to dynamic operation, adjusting address combinations based on real-time access patterns to relieve stress on frequently accessed memory cells.
Solution Approach 2:
The patent changes the parameter of address signal combinations dynamically. When a memory cell is frequently accessed, the aging detector triggers a change in the address signal parameters through the aging control signal, causing the address decoder to generate different internal address signals for the same external address, thereby distributing stress across multiple memory cells.
2Duration of action of stationary object
If address combinations are changed to relieve memory cell stress, then memory cell longevity improves, but the circuit requires additional aging detection and control components
Solution Approach 1:
The aging detector performs preliminary detection of access frequency before significant degradation occurs. By monitoring the number of access operations in advance and generating aging control signals proactively, the system can switch address combinations before memory cell stress becomes critical, extending operational longevity through preventive action.
Solution Approach 2:
The patent implements a feedback mechanism where aging detectors monitor access patterns and feed back aging control signals to the address generation circuit. This closed-loop feedback system automatically adjusts address signal combinations based on real-time memory cell usage patterns, enabling adaptive stress distribution without manual intervention.
3Measurement precision
If multiple aging detectors with different reference numbers are used, then address signal adjustment becomes more precise, but the circuit complexity increases
Solution Approach 1:
The patent segments the aging detection function into multiple aging detectors, each with different reference numbers for counting access operations. This segmentation allows different parts of the memory address space to be monitored with different precision levels, enabling fine-grained control over when address switching occurs based on specific access frequency thresholds.
Solution Approach 2:
Different aging detectors are assigned to different address lines or memory banks with locally optimized reference numbers. This local quality approach allows each segment of the memory system to have customized aging detection precision matched to its specific access patterns, improving overall measurement precision without uniformly increasing complexity across the entire system.
Data Source
AI summary
Internal address generation circuits are provided. The internal address generation circuit includes an aging detector and an address decoder. The aging detector generates an aging signal enabled when the number of times that an internal command signal for accessing memory cells is inputted is equal to or more than a reference number. The address decoder decodes an address signal in response to the aging signal to generate an internal address signal.