Internal Reference Resistor for Non-Volatile Memory Calibration
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Solution Overview
Problem
Existing memory sub-systems require external reference resistors, which increase costs, area, and assembly complexity, and necessitate additional pins, and recalibration due to supply voltage and temperature variations.
Innovation Solution
An internal reference resistor within the memory controller that can be adjusted and trimmed to achieve desired resistance values, reducing the need for external components and allowing for calibration based on voltage and temperature variations, with switchable resistor sections and stored trim values.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If external reference resistors are used, then calibration accuracy is maintained, but device complexity and assembly complexity increase
Solution Approach 1:
The patent integrates the reference resistor directly into the memory device die, merging two previously separate components (memory device and external reference resistor) into a single unified structure. This eliminates the need for external reference resistors and their associated mounting hardware, thereby reducing assembly complexity while maintaining calibration accuracy through on-die integration.
Solution Approach 2:
The reference resistor function is extracted from the external component realm and embedded directly within the memory device die. This extraction of the reference resistor from its traditional external position and its incorporation into the memory device itself resolves the contradiction by eliminating external connections while preserving the calibration function.
2Measurement precision
If external reference resistors are used, then calibration function is provided, but quantity of substance and area increase
Solution Approach 1:
By merging the reference resistor with the memory device die, the patent eliminates the need for separate external reference resistor components. This integration reduces the total quantity of substances (materials) required and minimizes the overall area occupied, as the reference resistor now shares the same die space rather than requiring additional external mounting area.
3Measurement precision
If external reference resistors are used, then reference resistance is provided, but productivity decreases
Solution Approach 1:
The integration of the reference resistor into the memory device die eliminates the need for separate assembly steps for mounting external reference resistors. This merging of functions allows the memory device to be manufactured and tested as a single unit, thereby improving productivity by reducing assembly steps and enabling faster production cycles.
Solution Approach 2:
The reference resistor is fabricated and integrated into the memory device die during the initial manufacturing process, rather than being added as a separate component during final assembly. This preliminary action of incorporating the reference resistor early in the manufacturing process eliminates subsequent assembly steps, thereby improving overall productivity.
4Adaptability or versatility
If supply voltage and temperature variations occur, then operational conditions change, but measurement precision deteriorates
Solution Approach 1:
The patent incorporates a feedback mechanism where the memory device controller monitors supply voltage and temperature conditions and adjusts the reference resistor value dynamically. This feedback loop compensates for environmental variations, maintaining calibration accuracy despite changes in operational conditions by actively adjusting the reference resistance based on real-time sensing of voltage and temperature.
Solution Approach 2:
The reference resistor is designed with dynamic adjustment capability, allowing its resistance value to change in response to supply voltage and temperature variations. This dynamic characteristic enables the reference resistor to adapt to different operational conditions, maintaining measurement precision across varying environments rather than being fixed at a single value.
Data Source
AI summary
An example apparatus include an array of memory cells. The example apparatus includes a memory controller coupled to the array. The memory controller can include an internal reference resistor. The memory controller can be configured to monitor memory characteristics for the array and the memory controller. The memory controller can be configured to trim the internal reference resistor to result in a target resistance value based on the memory characteristics.